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Volumn 110, Issue 17, 2013, Pages

Direct measurement of auger electrons emitted from a semiconductor light-emitting diode under electrical injection: Identification of the dominant mechanism for efficiency droop

Author keywords

[No Author keywords available]

Indexed keywords

DIRECT MEASUREMENT; DOMINANT MECHANISM; ELECTRICAL INJECTION; ELECTROLUMINESCENCE EFFICIENCIES; ELECTRON EMISSION SPECTRA; GAN LIGHT-EMITTING DIODES; HIGH-ENERGY ELECTRON; INGAN QUANTUM WELLS;

EID: 84877751647     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.110.177406     Document Type: Article
Times cited : (591)

References (27)
  • 1
    • 0020100455 scopus 로고
    • IEJQA7 0018-9197 10.1109/JQE.1982.1071543
    • See, e.g., A. Sugimura, IEEE J. Quantum Electron. 18, 352 (1982). IEJQA7 0018-9197 10.1109/JQE.1982.1071543
    • (1982) IEEE J. Quantum Electron. , vol.18 , pp. 352
    • Sugimura, A.1
  • 2
    • 34548180960 scopus 로고
    • JAPIAU 0021-8979 10.1063/1.1736034
    • W. Shockley and H. J. Queisser, J. Appl. Phys. 32, 510 (1961). JAPIAU 0021-8979 10.1063/1.1736034
    • (1961) J. Appl. Phys. , vol.32 , pp. 510
    • Shockley, W.1    Queisser, H.J.2
  • 8
    • 58149492901 scopus 로고    scopus 로고
    • APPLAB 0003-6951 10.1063/1.3058687
    • J. Xu, Appl. Phys. Lett. 94, 011113 (2009). APPLAB 0003-6951 10.1063/1.3058687
    • (2009) Appl. Phys. Lett. , vol.94 , pp. 011113
    • Xu, J.1
  • 13
    • 3843146014 scopus 로고
    • PRLTAO 0031-9007 10.1103/PhysRevLett.18.597
    • R. C. Eden, J. L. Moll, and W. E. Spicer, Phys. Rev. Lett. 18, 597 (1967). PRLTAO 0031-9007 10.1103/PhysRevLett.18.597
    • (1967) Phys. Rev. Lett. , vol.18 , pp. 597
    • Eden, R.C.1    Moll, J.L.2    Spicer, W.E.3
  • 14
    • 0000840067 scopus 로고
    • PRBMDO 0163-1829 10.1103/PhysRevB.31.3859
    • H.-J. Drouhin, C. Hermann, and G. Lampel, Phys. Rev. B 31, 3859 (1985); PRBMDO 0163-1829 10.1103/PhysRevB.31.3859
    • (1985) Phys. Rev. B , vol.31 , pp. 3859
    • Drouhin, H.-J.1    Hermann, C.2    Lampel, G.3
  • 17
    • 0018443533 scopus 로고
    • Energy loss and escape depth of hot electrons from shallow P-N junctions in silicon
    • DOI 10.1063/1.326126
    • I. Shahriary, J. R. Schwank, and F. G. Allen, J. Appl. Phys. 50, 1428 (1979). JAPIAU 0021-8979 10.1063/1.326126 (Pubitemid 9450165)
    • (1979) J Appl Phys , vol.50 , Issue.3 , pp. 1428-1438
    • Shahriary, I.1    Schwank, J.R.2    Allen, F.G.3
  • 18
    • 4243796406 scopus 로고
    • PRLTAO 0031-9007 10.1103/PhysRevLett.64.1682
    • J. Peretti, H.-J. Drouhin, and D. Paget, Phys. Rev. Lett. 64, 1682 (1990). PRLTAO 0031-9007 10.1103/PhysRevLett.64.1682
    • (1990) Phys. Rev. Lett. , vol.64 , pp. 1682
    • Peretti, J.1    Drouhin, H.-J.2    Paget, D.3
  • 21
    • 30744433587 scopus 로고    scopus 로고
    • Optical study of hot electron transport in GaN: Signatures of the hot-phonon effect
    • DOI 10.1063/1.2163709, 022103
    • K. Wang, J. Simon, N. Goel, and D. Jena, Appl. Phys. Lett. 88, 022103 (2006). APPLAB 0003-6951 10.1063/1.2163709 (Pubitemid 43100108)
    • (2006) Applied Physics Letters , vol.88 , Issue.2 , pp. 1-3
    • Wang, K.1    Simon, J.2    Goel, N.3    Jena, D.4
  • 25
    • 84870270755 scopus 로고    scopus 로고
    • SSTEET 0268-1242 10.1088/0268-1242/27/12/125003
    • F. Gütle, Semicond. Sci. Technol. 27, 125003 (2012). SSTEET 0268-1242 10.1088/0268-1242/27/12/125003
    • (2012) Semicond. Sci. Technol. , vol.27 , pp. 125003
    • Gütle, F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.