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Volumn 98, Issue 16, 2011, Pages

Indirect Auger recombination as a cause of efficiency droop in nitride light-emitting diodes

Author keywords

[No Author keywords available]

Indexed keywords

ALLOY SCATTERING; AUGER RECOMBINATION; EFFICIENCY LOSS; ELECTRON PHONON COUPLINGS; FIRST-PRINCIPLES CALCULATION; INJECTED CARRIERS; SOLID STATE LIGHTING;

EID: 79955380032     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3570656     Document Type: Article
Times cited : (480)

References (26)
  • 5
    • 35648955103 scopus 로고    scopus 로고
    • Defect related issues in the "current roll-off" in InGaN based light emitting diodes
    • DOI 10.1063/1.2801704
    • B. Monemar and B. E. Sernelius, Appl. Phys. Lett. 0003-6951 91, 181103 (2007). 10.1063/1.2801704 (Pubitemid 350037159)
    • (2007) Applied Physics Letters , vol.91 , Issue.18 , pp. 181103
    • Monemar, B.1    Sernelius, B.E.2
  • 13
  • 14
  • 15
    • 77957891166 scopus 로고    scopus 로고
    • 0031-8965, 10.1002/pssa.201026149
    • J. Piprek, Phys. Status Solidi A 0031-8965 207, 2217 (2010). 10.1002/pssa.201026149
    • (2010) Phys. Status Solidi A , vol.207 , pp. 2217
    • Piprek, J.1
  • 24
    • 27744562177 scopus 로고    scopus 로고
    • Supression of carrier recombination in semiconductor lasers by phase-space filling
    • DOI 10.1063/1.2132524, 201112
    • J. Hader, J. V. Moloney, and S. W. Koch, Appl. Phys. Lett. 0003-6951 87, 201112 (2005). 10.1063/1.2132524 (Pubitemid 41611383)
    • (2005) Applied Physics Letters , vol.87 , Issue.20 , pp. 1-3
    • Hader, J.1    Moloney, J.V.2    Koch, S.W.3
  • 26
    • 84923620471 scopus 로고    scopus 로고
    • (Cambridge University Press, Cambridge). 10.1017/CBO9780511790546
    • E. F. Schubert, Light-emitting Diodes (Cambridge University Press, Cambridge, 2006). 10.1017/CBO9780511790546
    • (2006) Light-emitting Diodes
    • Schubert, E.F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.