Atomic-scale imaging in real and energy space developed in ultrafast electron microscopy

Nano Letters

Volumn 7, Issue 9, 2007, Pages 2545-2551

  Park, Hyun Soon ^a   Baskin, J Spencer ^a   Kwon, Oh Hoon ^a   Zewail, Ahmed H ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC PHYSICS; DIFFRACTION PATTERNS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON MICROSCOPY; FOURIER ANALYSIS; IMAGE RESOLUTION; NANOSTRUCTURED MATERIALS; ULTRAFAST PHENOMENA;

ATOMIC-SCALE IMAGING; ENERGY FILTERED TRANSMISSION ELECTRON MICROSCOPY (EFTEM); ORGANOMETALLIC CRYSTALS; ULTRAFAST ELECTRON MICROSCOPY;

IMAGING SYSTEMS;

NANOPARTICLE;

ARTICLE; COMPUTER SYSTEM; ELECTRON MICROSCOPY; EQUIPMENT DESIGN; IMAGE ENHANCEMENT; INSTRUMENTATION; METHODOLOGY; ULTRASTRUCTURE;

COMPUTER SYSTEMS; EQUIPMENT DESIGN; IMAGE ENHANCEMENT; MICROSCOPY, ELECTRON; NANOPARTICLES;

EID: 34948857058     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl071369q     Document Type: Article

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