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Volumn 96, Issue 10, 2010, Pages

Droop in InGaN light-emitting diodes: A differential carrier lifetime analysis

Author keywords

[No Author keywords available]

Indexed keywords

ABC MODEL; CARRIER DENSITY; DOUBLE HETEROSTRUCTURES; INGAN/GAN; INJECTION CONDITIONS; INTERNAL QUANTUM EFFICIENCY; NON-RADIATIVE; NON-RADIATIVE LIFETIMES; PHASE SPACES; RECOMBINATION PROCESS;

EID: 77949745836     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3330870     Document Type: Article
Times cited : (310)

References (17)
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    • Interplay of built-in potential and piezoelectric field on carrier recombination in green light emitting InGaN quantum wells
    • DOI 10.1063/1.2786602
    • U. T. Schwarz, H. Braun, K. Kojima, Y. Kawakami, S. Nagahama, and T. Mukai, Appl. Phys. Lett. 0003-6951 91, 123503 (2007). 10.1063/1.2786602 (Pubitemid 47461958)
    • (2007) Applied Physics Letters , vol.91 , Issue.12 , pp. 123503
    • Schwarz, U.T.1    Braun, H.2    Kojima, K.3    Kawakami, Y.4    Nagahama, S.5    Mukai, T.6
  • 12
    • 0020845932 scopus 로고
    • 0013-5194,. 10.1049/el:19830686
    • D. Yevick and W. Streifer, Electron. Lett. 0013-5194 19, 1012 (1983). 10.1049/el:19830686
    • (1983) Electron. Lett. , vol.19 , pp. 1012
    • Yevick, D.1    Streifer, W.2
  • 13
    • 77949682450 scopus 로고    scopus 로고
    • 2, which is retrospectively verified here. However in general the derived value of τSRH is robust against deviations from this assumption.
    • 2, which is retrospectively verified here. However in general the derived value of τSRH is robust against deviations from this assumption.
  • 16
    • 65349159730 scopus 로고    scopus 로고
    • 0277-786X.
    • U. T. Schwarz, Proc. SPIE 0277-786X 7216, 7216U (2009).
    • (2009) Proc. SPIE , vol.7216
    • Schwarz, U.T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.