Four-dimensional imaging of carrier interface dynamics in p-n junctions

Science

Volumn 347, Issue 6218, 2015, Pages 164-167

  Najafi, Ebrahim ^a   Scarborough, Timothy D ^a   Tang, Jau ^a,b   Zewail, Ahmed ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^b NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON;

FOUR-DIMENSIONAL MODELING; IMAGING METHOD; INTERFACE; SILICON; SPATIOTEMPORAL ANALYSIS;

ARTICLE; DENSITY; DIFFUSION; ELECTRIC FIELD; ELECTRON; ELECTRON MICROSCOPY; EXCITATION; FIELD EMISSION; FOUR DIMENSIONAL IMAGING; IMAGING AND DISPLAY; PRIORITY JOURNAL; SCANNING ULTRAFAST ELECTRON MICROSCOPY;

EID: 84923271293     PISSN: 00368075     EISSN: 10959203     Source Type: Journal    
DOI: 10.1126/science.aaa0217     Document Type: Article

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