Real-Space Imaging of Carrier Dynamics of Materials Surfaces by Second-Generation Four-Dimensional Scanning Ultrafast Electron Microscopy

Journal of Physical Chemistry Letters

Volumn 6, Issue 19, 2015, Pages 3884-3890

  Sun, Jingya ^a   Melnikov, Vasily A ^a   Khan, Jafar I ^a   Mohammed, Omar F ^a  

^a KING ABDULLAH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Saudi Arabia)

Author keywords

electron impact dynamics; energy loss; photon impact dynamics; surface dynamics; ultrafast electron microscopy

Indexed keywords

CONVERSION EFFICIENCY; DYNAMICS; ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; ELECTRONS; ENERGY CONVERSION; ENERGY DISSIPATION; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTIES;

ELECTRON IMPACT; NANO-SCALE MATERIALS; PHOTOACTIVE MATERIALS; PHOTON IMPACT; PRIMARY ELECTRON BEAMS; SURFACE DYNAMICS; TEMPORAL AND SPATIAL; ULTRAFAST ELECTRON MICROSCOPY;

SURFACE DEFECTS;

EID: 84943145475     PISSN: None     EISSN: 19487185     Source Type: Journal    
DOI: 10.1021/acs.jpclett.5b01867     Document Type: Article

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