Infrared Imaging and Spectroscopy beyond the Diffraction Limit∗

Annual Review of Analytical Chemistry

Volumn 8, Issue , 2015, Pages 101-126

  Centrone, Andrea ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Chemical composition; Nanomaterials; Nanoscale infrared spectroscopy; PTIR; Resonance enhanced AFM IR; S SNOM

Indexed keywords

DIFFRACTION; INFRARED SPECTROSCOPY; NANOSTRUCTURED MATERIALS; THERMOGRAPHY (IMAGING);

BIOLOGICAL APPLICATIONS; CHEMICAL COMPOSITIONS; CHEMICAL IDENTIFICATION; MEASUREMENT METHODS; NANO SCALE; NANOSCALE RESOLUTIONS; PTIR; STRUCTURAL INFORMATION;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

NANOMATERIAL;

ANIMAL; ATOMIC FORCE MICROSCOPY; CHEMISTRY; FLUORESCENCE IMAGING; HUMAN; INFRARED SPECTROPHOTOMETRY; NANOTECHNOLOGY; PROCEDURES;

ANIMALS; HUMANS; MICROSCOPY, ATOMIC FORCE; NANOSTRUCTURES; NANOTECHNOLOGY; OPTICAL IMAGING; SPECTROPHOTOMETRY, INFRARED;

EID: 84937436311     PISSN: 19361327     EISSN: 19361335     Source Type: Book Series    
DOI: 10.1146/annurev-anchem-071114-040435     Document Type: Review

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