Nanoscale infrared spectroscopy: Improving the spectral range of the photothermal induced resonance technique

Analytical Chemistry

Volumn 85, Issue 4, 2013, Pages 1972-1979

  Katzenmeyer, Aaron M ^a   Aksyuk, Vladimir ^a   Centrone, Andrea ^a,b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFM TIP; ATOMIC FORCE; CHEMICAL IMAGING; CHEMICAL SPECIFICITY; COMPOSITE SAMPLES; DIFFERENCE-FREQUENCY GENERATION; GASE CRYSTALS; IR SPECTRUM; LASER SOURCES; LATERAL RESOLUTION; LIGHT DIFFRACTION; MATERIALS CHARACTERIZATION; NANO SCALE; NANOSCALE ANALOG; PHOTO-THERMAL; PULSE LENGTH; RESONANCE TECHNIQUE; SIGNAL GENERATION; SPATIAL RESOLUTION; SPECTRAL RANGE; TUNABILITIES; TUNABLE PULSED LASERS;

ATOMIC FORCE MICROSCOPY; CHARACTERIZATION; DIFFRACTION; INFRARED SPECTROSCOPY; LASER TUNING; LASERS; LIGHT ABSORPTION; OPTICAL FREQUENCY CONVERSION; SIGNAL GENERATORS;

NANOTECHNOLOGY;

EPOXIDE; NANOMATERIAL; POLY(METHYL METHACRYLATE); POLYSTYRENE DERIVATIVE; SILICON DIOXIDE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; EQUIPMENT; INFRARED SPECTROPHOTOMETRY; LASER; METHODOLOGY; TEMPERATURE;

EPOXY COMPOUNDS; LASERS; MICROSCOPY, ATOMIC FORCE; NANOSTRUCTURES; POLYMETHYL METHACRYLATE; POLYSTYRENES; SILICON DIOXIDE; SPECTROPHOTOMETRY, INFRARED; TEMPERATURE;

EID: 84874084683     PISSN: 00032700     EISSN: 15206882     Source Type: Journal    
DOI: 10.1021/ac303620y     Document Type: Article

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