Apertureless scanning near-field optical microscopy: A comparison between homodyne and heterodyne approaches

Journal of the Optical Society of America B: Optical Physics

Volumn 23, Issue 5, 2006, Pages 823-833

  Gomez, Lewis ^a   Bachelot, Renaud ^a,b   Bouhelier, Alexandre ^a,e   Wiederrecht, Gary P ^a   Chang, Shih Hui ^a   Gray, Stephen K ^a   Hua, Feng ^c   Jeon, Seokwoo ^c   Rogers, John A ^c   Castro, Miguel E ^d   Blaize, Sylvain ^b   Stefanon, Ilan ^b   Lerondel, Gilles ^b   Royer, Pascal ^b  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b UNIVERSITÉ DE TECHNOLOGIE DE TROYES   (France)

^c United States of America   (United States)

^d UNIVERSITY OF PUERTO RICO   (Puerto Rico)

^e UNIVERSITÉ DE BOURGOGNE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFEROMETRY; LIGHT INTERFERENCE; REFLECTION; WAVEGUIDES;

APERTURELESS SCANNING; COHERENT HOMODYNE; INTERFEROMETRIC EFFECT; NEAR-FIELD ANALYSIS;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

EID: 33745744539     PISSN: 07403224     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAB.23.000823     Document Type: Article

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