Atomic force microscope infrared spectroscopy on 15 nm scale polymer nanostructures

Review of Scientific Instruments

Volumn 84, Issue 2, 2013, Pages

  Felts, Jonathan R ^a   Cho, Hanna ^a   Yu, Min Feng ^b   Bergman, Lawrence A ^a   Vakakis, Alexander F ^a   King, William P ^a  

^a University of Illinois at Urbana Champaign   (United States)

^b Georgia Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPE (AFM); CANTILEVER VIBRATIONS; INFRARED SPECTRUM; PHOTOTHERMAL EXPANSION; POLYMER NANOSTRUCTURES; THERMO-MECHANICAL RESPONSE; TIME AND FREQUENCIES; TIME-FREQUENCY DOMAIN ANALYSIS;

FOURIER TRANSFORM INFRARED SPECTROSCOPY; FREQUENCY DOMAIN ANALYSIS; LIGHT ABSORPTION; NANOCANTILEVERS; NANOSTRUCTURES; POLYETHYLENES;

ATOMIC FORCE MICROSCOPY;

EID: 84874844719     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4793229     Document Type: Conference Paper

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