Visibility of weak contrasts in subsurface scattering near-field microscopy

Ultramicroscopy

Volumn 126, Issue , 2013, Pages 40-43

  Engelhardt, Andreas P ^a   Hauer, Benedikt ^a   Taubner, Thomas ^a  

^a RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

Contrast; Near field microscopy; Signal to noise ratio; Subsurface imaging

Indexed keywords

BURIED STRUCTURE; CONTRAST; HIGH CONTRAST; IMAGE CONTRASTS; LOW NOISE; NEAR FIELD MICROSCOPY; SCATTERING-TYPE SCANNING NEAR-FIELD OPTICAL MICROSCOPY (S-SNOM); SIGNAL STRENGTHS; SUB-SURFACE IMAGING; SUBSURFACE SCATTERING; SYSTEMATIC STUDY; VIBRATION AMPLITUDE;

MICROSCOPIC EXAMINATION; MOLECULAR PHYSICS;

VISIBILITY;

ARTICLE; CONTRAST TO NOISE RATIO; CONTROLLED STUDY; IMAGE ANALYSIS; IMAGE DISPLAY; LIGHT SCATTERING; LIMIT OF DETECTION; PROCESS OPTIMIZATION; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SIGNAL NOISE RATIO; STRUCTURE ANALYSIS; SURFACE PROPERTY; VIBRATION; VISIBILITY;

EID: 84873247634     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2012.12.010     Document Type: Article

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