Infrared-spectroscopic nanoimaging with a thermal source

Nature Materials

Volumn 10, Issue 5, 2011, Pages 352-356

  Huth, F ^a,b   Schnell, M ^a   Wittborn, J ^c   Ocelic, N ^b   Hillenbrand, R ^a,d  

^a CIC NANOGUNE   (Spain)

^b Neaspec GmbH   (Germany)

^c INFINEON TECHNOLOGIES AG   (Germany)

^d BASQUE FOUNDATION FOR SCIENCE   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

BIOMEDICAL ENGINEERING; CARRIER CONCENTRATION; CHEMICAL ANALYSIS; DIELECTRIC PROPERTIES; DIFFRACTION; IMAGE RESOLUTION; INFRARED SPECTROSCOPY; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICES; SILICON OXIDES; SPECTROMETERS; SPECTROSCOPY;

BIOMEDICAL MATERIAL; CHEMICAL IDENTIFICATION; CONTACT-FREE MEASUREMENTS; FREE CARRIER CONCENTRATION; FT-IR-SPECTROMETERS; INFRARED SPECTROSCOPIC; ORDERS OF MAGNITUDE; SPECTROSCOPIC IDENTIFICATION;

FOURIER TRANSFORM INFRARED SPECTROSCOPY;

EID: 79955024783     PISSN: 14761122     EISSN: 14764660     Source Type: Journal    
DOI: 10.1038/nmat3006     Document Type: Article

References (36)

1. Griffiths, P. R. & de Haseth, J. A. Fourier Transform Infrared Spectrometry (Wiley, 2007).
2. Garczarek, F. & Gerwert, K. Functional waters in intraprotein proton transfer monitored by FTIR difference spectroscopy. Nature 439, 109-112 (2006). (Pubitemid 43053638)
3. Li, Z. Q. et al. Dirac charge dynamics in graphene by infrared spectroscopy. Nature Phys. 4, 532-535 (2008).
4. Novotny, L. & Hecht, B. Principles of Nano-Optics (Cambridge Univ. Press, 2006).
5. Schuller, J. A. et al. Plasmonics for extreme light concentration and manipulation. Nature Mater. 9, 193-204 (2010).
6. Hillenbrand, R., Taubner, T. & Keilmann, F. Phonon-enhanced light-matter interaction at the nanometre scale. Nature 418, 159-162 (2002). (Pubitemid 34773765)
7. Russell, E. E. & Bell, E. E. Measurement of the optical constants of crystal quartz in the far infrared with the asymmetric Fourier-Transform method. J. Optical Soc. Amer. 57, 341-348 (1967).
8. Kawata, S. & Inouye, Y. Scanning probe optical microscopy using a metallic probe tip. Ultramicroscopy 57, 313-317 (1995).
9. Knoll, B. & Keilmann, F. Near-field probing of vibrational absorption for chemical microscopy. Nature 399, 134-137 (1999).
10. Zenhausern, F., Martin, Y. & Wickramasinghe, H. K. Scanning interferometric apertureless microscopy: Optical imaging at 10 angstrom resolution. Science 269, 1083-1085 (1995).
11. Bachelot, R., Gleyzes, P. & Boccara, A. C. Near-field optical microscope based on local perturbation of a diffraction spot. Opt. Lett. 20, 1924-1926 (1995).
12. Keilmann, F. & Hillenbrand, R. Nano-Optics and Near-Field Optical Microscopy (Artech House, 2008).
13. Taubner, T., Hillenbrand, R. & Keilmann, F. Nanoscale polymer recognition by spectral signature in scattering infrared near-field microscopy. Appl. Phys. Lett. 85, 5064-5066 (2004). (Pubitemid 40715215)
14. Zentgraf, T. et al. Amplitude-and phase-resolved optical near fields of split-ring-resonantor-based metamaterals. Opt. Lett. 33, 848-850 (2008). (Pubitemid 351656672)
15. Kehr, S. C. et al. Anisotropy contrast in phonon-enhanced apertureless near-field microscopy using a free-electron laser. Phys. Rev. Lett. 100, 256403 (2008).
16. Brehm, M., Taubner, T., Hillenbrand, R. & Keilmann, F. Infrared spectroscopic mapping of single nanoparticles and viruses at nanoscale resolution. Nano Lett. 6, 1307-1310 (2006). (Pubitemid 44195300)
17. Huber, A. J., Kazantsev, D., Keilmann, F., Wittborn, J. & Hillenbrand, R. Simultaneous IR material recognition and conductivity mapping by nanoscale near-field microscopy. Adv. Mater. 19, 2209-2212 (2007). (Pubitemid 47409278)
18. Brehm, M., Schliesser, A. & Keilmann, F. Spectroscopic near-field microscopy using frequency combs in the mid-infrared. Opt. Exp. 14, 11222-11233 (2006). (Pubitemid 44771971)
19. Amarie, S. & Keilmann, F. Broadband-infrared assessment of phonon resonance in scattering-type near-field microscopy. Phys. Rev. B 83, 045404 (2011).
20. De Wilde, Y. et al. Thermal radiation scanning tunnelling microscopy. Nature 444, 740-743 (2006). (Pubitemid 44949600)
21. Raschke, M. B. US Patent Application No. US2010/0045970 A1.
22. Raschke, M. B. et al. Apertureless near-field vibrational imaging of block-copolymer nanostructures with ultrahigh spatial resolution. ChemPhysChem 6, 2197-2203 (2005). (Pubitemid 41503711)
23. Akhremitchev, B. B., Pollack, S. & Walker, G. C. Apertureless scanning near-field infrared microscopy of a rough polymeric surface. Langmuir 17, 2774-2781 (2001). (Pubitemid 35330533)
24. Keilmann, F. Vibrational-infrared near-field microscopy. Vib. Spectrosc. 29, 109-114 (2002). (Pubitemid 34660615)
25. Samson, J-S. et al. Setup of a scanning near field infrared microscope (SNIM): Imaging of sub-surface nano-structures in gallium-doped silicon. Phys. Chem. Chem. Phys. 8, 753-758 (2006).
26. Cvitkovic, A., Ocelic, N., Aizpurua, J., Guckenberger, R. & Hillenbrand, R. Infrared imaging of single nanoparticles via strong field enhancement in a scanning nanogap. Phys. Rev. Lett. 97, 060801 (2006).
27. Brehm, M., Schliesser, A., Cajko, F., Tsukerman, I. & Keilmann, F. Antenna-mediated back-scattering efficiency in infrared near-field microscopy. Opt. Express 16, 11203-11215 (2008).
28. Ocelic, N. & Hillenbrand, R. Optical device for measuring modulated signal light. Patent No. EP1770714B1 and US 7738115 B2.
29. Labardi, M, Patane, S. & Allegrini, M. Artifact-free near-field optical imaging by apertureless microscopy. Appl. Phys. Lett. 77, 621-623 (2000).
30. Hillenbrand, R. & Keilmann, F. Complex optical constants on a subwavelength scale. Phys. Rev. Lett. 85, 3029-3032 (2000).
31. Huber, A. J., Wittborn, J. & Hillenbrand, R. Infrared spectroscopic near-field mapping of single nanotransistors. Nanotechnology 21, 235702 (2010).
32. Cvitkovic, A., Ocelic, N. & Hillenbrand, R. Analytical model for quantitative prediction of material contrasts in scattering-type near-field optical microscopy. Opt. Express 15, 8550-8565 (2007). (Pubitemid 47112466)
33. Gunde, M. K. Vibrational modes in amorphous silicon dioxide. Physica B 292, 286-295 (2000).
34. Masetti, G., Severi, M. & Solmi, S. Modelling of carrier mobility against carrier concentration in arsenic-, phosphorus-, and boron-doped silicon. IEEE Trans. Electron Devices 30, 764-769 (1983). (Pubitemid 13588640)
35. Stiegler, J. M. et al. Nanoscale free-carrier profiling of individual semiconductor nanowires by infrared near-field nanoscopy. Nano Lett. 10, 1387-1392 (2010).
36. Huber, A. J., Ziegler, A., Kock, T. & Hillenbrand, R. Infrared nanoscopy of strained semiconductors. Nature Nanotech. 4, 153-157 (2009).