Quantitative measurement of local infrared absorption and dielectric function with tip-enhanced near-field microscopy

Journal of Physical Chemistry Letters

Volumn 4, Issue 9, 2013, Pages 1526-1531

  Govyadinov, Alexander A ^a   Amenabar, Iban ^a   Huth, Florian ^a,b   Scott Carney, P ^c   Hillenbrand, Rainer ^a,d  

^a CIC NANOGUNE   (Spain)

^b Neaspec GmbH   (Germany)

^c University of Illinois at Urbana Champaign   (United States)

^d BASQUE FOUNDATION FOR SCIENCE   (Spain)

Author keywords

chemical identification; ellipsometry; infrared nanospectroscopy; nano FTIR; near field scattering; s SNOM; thin films

Indexed keywords

CHEMICAL IDENTIFICATION; DIELECTRIC PERMITTIVITIES; FOURIER TRANSFORM INFRA REDS; LOCAL DIELECTRIC CONSTANT; NANO-FTIR; NEAR-FIELD SCATTERING; S-SNOM; SCATTERING-TYPE SCANNING NEAR-FIELD OPTICAL MICROSCOPY (S-SNOM);

ELLIPSOMETRY; INFRARED ABSORPTION; LIGHT ABSORPTION; PERMITTIVITY; SCATTERING; THIN FILMS;

FOURIER TRANSFORM INFRARED SPECTROSCOPY;

EID: 84877134942     PISSN: None     EISSN: 19487185     Source Type: Journal    
DOI: 10.1021/jz400453r     Document Type: Article

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