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Physical Review B - Condensed Matter and Materials Physics

Volumn 85, Issue 7, 2012, Pages

Near-field spectroscopy of silicon dioxide thin films

(9) Zhang, L M a Andreev, G O b Fei, Z b McLeod, A S b Dominguez, G b Thiemens, M b Castro Neto, A H c Basov, D N b Fogler, M M b

a Boston University (United States)

b UNIVERSITY OF CALIFORNIA (United States)

c National University of Singapore (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84863275774 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.85.075419 Document Type: Article

Times cited : (103)

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