Near-field imaging of optical antenna modes in the mid-infrared

Optics Express

Volumn 16, Issue 25, 2008, Pages 20295-20305

  Olmon, Robert L ^a,b   Krenz, Peter M ^c   Jones, Andrew C ^a   Boreman, Glenn D ^c   Raschke, Markus B ^a  

^a UNIVERSITY OF WASHINGTON   (United States)

^b University of Washington   (United States)

^c UNIVERSITY OF CENTRAL FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANTENNAS; NATURAL FREQUENCIES; OPTICAL INSTRUMENTS; OPTICAL MATERIALS; SCANNING ANTENNAS;

CURRENT OSCILLATION; EFFECTIVE WAVELENGTH; EXPERIMENTAL CONFIRMATION; LOCALIZED EXCITATIONS; MATERIAL PARAMETER; NEAR FIELD IMAGING; NEAR-FIELD ANTENNAS; SCATTERING-TYPE SCANNING NEAR-FIELD OPTICAL MICROSCOPY (S-SNOM);

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

NANOMATERIAL;

ARTICLE; ATOMIC FORCE MICROSCOPY; COMPUTER AIDED DESIGN; COMPUTER SIMULATION; EQUIPMENT; EQUIPMENT DESIGN; INFRARED RADIATION; INSTRUMENTATION; INTERFEROMETRY; LIGHT; METHODOLOGY; RADIATION SCATTERING; THEORETICAL MODEL; ULTRASTRUCTURE;

COMPUTER SIMULATION; COMPUTER-AIDED DESIGN; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; INFRARED RAYS; INTERFEROMETRY; LIGHT; MICROSCOPY, ATOMIC FORCE; MODELS, THEORETICAL; NANOSTRUCTURES; SCATTERING, RADIATION;

EID: 57349162025     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.16.020295     Document Type: Article

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