Near-field imaging and nano-Fourier-transform infrared spectroscopy using broadband synchrotron radiation

Optics Express

Volumn 21, Issue 3, 2013, Pages 2913-2919

  Hermann, Peter ^a   Hoehl, Arne ^a   Patoka, Piotr ^b   Huth, Florian ^c   Rühl, Eckart ^b   Ulm, Gerhard ^a  

^a PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

^b FREIE UNIVERSITÄT BERLIN   (Germany)

^c Neaspec GmbH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL CONSTANTS; OPTICS;

BROADBAND RADIATION; LOW-INTENSITY; NEAR FIELD IMAGING; SCANNING NEAR-FIELD OPTICAL MICROSCOPY; SPATIAL RESOLUTION; WIDE SPECTRAL RANGE;

SYNCHROTRON RADIATION;

ARTICLE; EQUIPMENT; EQUIPMENT DESIGN; EQUIPMENT FAILURE; IMAGE ENHANCEMENT; INFRARED SPECTROSCOPY; MICROSCOPY; NANOTECHNOLOGY; SYNCHROTRON;

EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; IMAGE ENHANCEMENT; MICROSCOPY; NANOTECHNOLOGY; SPECTROSCOPY, FOURIER TRANSFORM INFRARED; SYNCHROTRONS;

EID: 84874056341     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.21.002913     Document Type: Article

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