Improved atomic force microscope infrared spectroscopy for rapid nanometer-scale chemical identification

Nanotechnology

Volumn 24, Issue 44, 2013, Pages

  Cho, Hanna ^a   Felts, Jonathan R ^a   Yu, Min Feng ^a   Bergman, Lawrence A ^a   Vakakis, Alexander F ^a   King, William P ^a  

^a University of Illinois at Urbana Champaign   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CANTILEVER VIBRATIONS; CHEMICAL IDENTIFICATION; FREQUENCY-DOMAIN DATA; INTEGRATED MAGNITUDE; LOW SIGNAL-TO-NOISE RATIO; MORLET WAVELET TRANSFORM; PHOTOTHERMAL EXPANSION; VIBRATIONAL ENERGIES;

DYNAMIC RESPONSE; INFRARED IMAGING; INFRARED SPECTROSCOPY; NANOCANTILEVERS; POLYMER FILMS;

ATOMIC FORCE MICROSCOPY;

EID: 84885742214     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/24/44/444007     Document Type: Article

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