Strong plasmon reflection at nanometer-size gaps in monolayer graphene on SiC

Nano Letters

Volumn 13, Issue 12, 2013, Pages 6210-6215

  Chen, Jianing ^a   Nesterov, Maxim L ^b   Nikitin, Alexey Yu ^a,c   Thongrattanasiri, Sukosin ^d,e   Alonso González, Pablo ^a   Slipchenko, Tetiana M ^b   Speck, Florian ^f   Ostler, Markus ^g   Seyller, Thomas ^g   Crassee, Iris ^h   Koppens, Frank H L ⁱ   Martin Moreno, Luis ^b   García De Abajo, F Javier ^d,i   Kuzmenko, Alexey B ^h   Hillenbrand, Rainer ^a,c  

^a CIC NANOGUNE   (Spain)

^b UNIVERSITY OF ZARAGOZA   (Spain)

^c BASQUE FOUNDATION FOR SCIENCE   (Spain)

^d INSTITUCIÓ CATALANA DE RECERCA I ESTUDIS AVANÇATS ICREA   (Spain)

^e KASETSART UNIVERSITY   (Thailand)

^f UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

^g CHEMNITZ UNIVERSITY OF TECHNOLOGY   (Germany)

^h UNIVERSITY OF GENEVA   (Switzerland)

ⁱ ICFO INSTITUT DE CIENCIES FOTONIQUES   (Spain)

Author keywords

Graphene; graphene plasmons; near field microscopy; plasmon reflection; s SNOM; SiC

Indexed keywords

GRAPHENE PLASMONS; NEAR FIELD MICROSCOPY; PLASMON REFLECTIONS; S-SNOM; SIC;

ELECTROMAGNETIC FIELDS; MONOLAYERS; NANOTECHNOLOGY; OPTICAL PROPERTIES; PLASMONS; SILICON CARBIDE;

GRAPHENE;

GRAPHITE; INORGANIC COMPOUND; NANOMATERIAL; SILICON CARBIDE; SILICON DERIVATIVE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; ELECTROMAGNETIC FIELD; SURFACE PLASMON RESONANCE; SURFACE PROPERTY;

CARBON COMPOUNDS, INORGANIC; ELECTROMAGNETIC FIELDS; GRAPHITE; MICROSCOPY, ATOMIC FORCE; NANOSTRUCTURES; SILICON COMPOUNDS; SURFACE PLASMON RESONANCE; SURFACE PROPERTIES;

EID: 84890383969     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl403622t     Document Type: Article

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