Nanometer-scale infrared spectroscopy of heterogeneous polymer nanostructures fabricated by tip-based nanofabrication

ACS Nano

Volumn 6, Issue 9, 2012, Pages 8015-8021

  Felts, Jonathan R ^a   Kjoller, Kevin ^b   Lo, Michael ^b   Prater, Craig B ^b   King, William P ^a  

^a University of Illinois at Urbana Champaign   (United States)

^b Anasys Instruments   (United States)

Author keywords

AFM; AFM IR; atomic force microscope; nanolithography; photothermal induced resonance; TBN; tDPN; thermal dip pen nanolithography; tip based nanofabrication

Indexed keywords

AFM; AFM-IR; ATOMIC FORCE MICROSCOPE (AFM); PHOTO-THERMAL; TBN; TDPN; THERMAL DIP-PEN NANOLITHOGRAPHY;

IMAGE PROCESSING; INFRARED SPECTROSCOPY; NANOLITHOGRAPHY; NANOSTRUCTURES; POLYMERS; POLYSTYRENES;

ATOMIC FORCE MICROSCOPY;

NANOMATERIAL; POLYMER;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; CONFORMATION; INFRARED SPECTROPHOTOMETRY; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; PARTICLE SIZE; SURFACE PROPERTY; ULTRASTRUCTURE;

MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MICROSCOPY, ATOMIC FORCE; MOLECULAR CONFORMATION; NANOSTRUCTURES; PARTICLE SIZE; POLYMERS; SPECTROPHOTOMETRY, INFRARED; SURFACE PROPERTIES;

EID: 84866703337     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn302620f     Document Type: Article

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