Substrate-enhanced infrared near-field spectroscopy

Optics Express

Volumn 16, Issue 3, 2008, Pages 1529-1545

  Aizpurua, Javier ^a   Taubner, Thomas ^b,c   García De Abajo, F Javier ^d   Brehm, Markus ^c   Hillenbrand, Rainer ^c,e  

^a DONOSTIA INTERNATIONAL PHYSICS CENTER DIPC   (Spain)

^b STANFORD UNIVERSITY   (United States)

^c MAX PLANCK INSTITUTE OF BIOCHEMISTRY   (Germany)

^d INSTITUTO DE ÓPTICA   (Spain)

^e CIC NANOGUNE   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE SCATTERING; INFRARED SPECTROSCOPY; NEAR FIELD SCANNING OPTICAL MICROSCOPY; POLYMETHYL METHACRYLATES; SPECTRUM ANALYSIS;

NEAR FIELD INFRARED SPECTROSCOPY; POLYMER VIBRATIONAL SPECTRUM; RESONANT TIP-SUBSTRATE INTERACTION;

SIGNAL DETECTION;

ARTICLE; ATOMIC FORCE MICROSCOPY; COMPUTER AIDED DESIGN; COMPUTER SIMULATION; EQUIPMENT; EQUIPMENT DESIGN; IMAGE ENHANCEMENT; INFRARED SPECTROPHOTOMETRY; INSTRUMENTATION; THEORETICAL MODEL;

COMPUTER SIMULATION; COMPUTER-AIDED DESIGN; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; IMAGE ENHANCEMENT; MICROSCOPY, ATOMIC FORCE; MODELS, THEORETICAL; SPECTROPHOTOMETRY, INFRARED;

EID: 39049141658     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.16.001529     Document Type: Article

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