Nanoscale-resolved subsurface imaging by scattering-type near-field optical microscopy

Optics Express

Volumn 13, Issue 22, 2005, Pages 8893-8899

  Taubner, T ^a   Keilmann, F ^a   Hillenbrand, R ^a  

^a MAX PLANCK INSTITUTE OF BIOCHEMISTRY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT SCATTERING; NANOTECHNOLOGY; SURFACE TOPOGRAPHY;

MID-INFRARED WAVELENGTHS; NEAR-FIELD PROBING; OXIDE LAYERS; SCATTERING-TYPE SCANNING NEAR-FIELD OPTICAL MICROSCOPY (S-SNOM);

OPTICAL MICROSCOPY;

EID: 27544467838     PISSN: 10944087     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OPEX.13.008893     Document Type: Article

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