Chemical imaging beyond the diffraction limit: Experimental validation of the PTIR technique

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Volumn 9, Issue 3, 2013, Pages 439-445

  Lahiri, Basudev ^a,b   Holland, Glenn ^a   Centrone, Andrea ^a,b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b UNIVERSITY OF MARYLAND   (United States)

Author keywords

AFM; chemical imaging; electron beam lithography; infrared spectroscopy; nanoscale characterization

Indexed keywords

AFM; ATOMIC FORCE MICROSCOPY HEIGHT IMAGES; CHEMICAL IDENTIFICATION; CHEMICAL IMAGING; CHEMICAL MAPS; DIFFRACTION LIMITS; EXPERIMENTAL VALIDATIONS; LATERAL RESOLUTION; NANO SCALE; NANOSCALE CHARACTERIZATION; NANOSCALE RESOLUTIONS; PHOTO-THERMAL; POLYMER SAMPLES; QUANTITATIVE CHEMICAL ANALYSIS; RESONANCE TECHNIQUE; SIGNAL GENERATION THEORY; ZINC SELENIDE;

ATOMIC FORCE MICROSCOPY; DIFFRACTION; ELECTRON BEAM LITHOGRAPHY; ELECTRON BEAMS; INFRARED SPECTROSCOPY; NANOTECHNOLOGY; SIGNAL GENERATORS; THERMAL EXPANSION;

CHEMICAL ANALYSIS;

EID: 84873359192     PISSN: 16136810     EISSN: 16136829     Source Type: Journal    
DOI: 10.1002/smll.201200788     Document Type: Article

References (37)

1. a) D. G. Cahill, W. K. Ford, K. E. Goodson, G. D. Mahan, A. Majumdar, H. J. Maris, R. Merlin, Phillpot. Sr., J. Appl. Phys. 2003, 93, 793
2. b) A. Centrone, E. Penzo, M. Sharma, J. W. Myerson, A. M. Jackson, N. Marzari, F. Stellacci, Proc. Natl. Acad. Sci USA 2008, 105, 9886
3. c) M. A. El-Sayed, Acc. Chem. Res. 2001, 34, 257.
4. L. J. Zhang, T. J. Webster, Nano Today 2009, 4, 66.
5. A. J. Huber, J. Wittborn, R. Hillenbrand, Nanotechnology 2010, 21, 235702.
6. P. G. Nicholson, F. A. Castro, Nanotechnology 2010, 21, 492001.
7. D. C. Fernandez, R. Bhargava, S. M. Hewitt, I. W. Levin, Nat. Biotechnol. 2005, 23, 469.
8. J. H. Park, G. von Maltzahn, L. Ong, A. Centrone, T. A. Hatton, E. Ruoslahti, S. N. Bhatia, M. J. Sailor, Adv. Mater. 2009, 22, 880.
9. a) A. Centrone, Y. Hu, A. M. Jackson, G. Zerbi, F. Stellacci, Small 2007, 3, 814
10. b) G. R. Rao, C. Castiglioni, M. Gussoni, G. Zerbi, E. Martuscelli, Polymer 1985, 26, 811.
11. a) C. Petibois, M. Piccinini, M. C. Guidi, A. Marcelli, J. Synchrotron Radiat. 2010, 17, 1
12. b) M. J. Nasse, M. J. Walsh, E. C. Mattson, R. Reininger, A. Kajdacsy-Balla, V. Macias, R. Bhargava, C. J. Hirschmugl, Nat. Methods 2011, 8, 413.
13. B. Knoll, F. Keilmann, Nature 1999, 399, 134.
14. a) R. Hillenbrand, T. Taubner, F. Keilmann, Nature 2002, 418, 159
15. b) A. Michaels, S. J. Stranick, L. J. Richter, R. R. Cavanagh, J. Appl. Phys. 2000, 88, 4832
16. c) L. Bozec, A. Hammiche, H. M. Pollock, M. Conroy, J. M. Chalmers, N. J. Everall, L. Turin, J. Appl. Phys. 2001, 90, 5159
17. d) L. Bozec, A. Hammiche, M. J. Tobin, J. M. Chalmers, N. J. Everall, H. M. Pollock, Meas. Sci. Technol. 2002, 13, 1217.
18. A. Dazzi, R. Prazeres, F. Glotin, J. M. Ortega, Ultramicroscopy 2007, 107, 1194.
19. M. Brehm, T. Taubner, R. Hillenbrand, F. Keilmann, Nano Lett. 2006, 6, 1307.
20. a) B. Knoll, F. Keilmann, Opt. Commun. 2000, 182, 321
21. b) A. Cvitkovic, N. Ocelic, R. Hillenbrand, Opt. Express 2007, 15, 8550.
22. A. Dazzi, R. Prazeres, E. Glotin, J. M. Ortega, Opt. Lett. 2005, 30, 2388.
23. A. Dazzi, R. Prazeres, F. Glotin, J. M. Ortega, M. Al-Sawaftah, M. de Frutos, Ultramicroscopy 2008, 108, 635.
24. C. Mayet, A. Dazzi, R. Prazeres, J. M. Ortega, D. Jaillard, Analyst 2010, 135, 2540.
25. C. Marcott, M. Lo, K. Kjoller, C. Prater, I. Noda, Appl. Spectrosc. 2011, 65, 1145.
26. K. Kjoller, J. R. Felts, D. Cook, C. B. Prater, W. P. King, Nanotechnology 2010, 21, 185705
27. A. Dazzi, in Thermal Nanosystems and Nanomaterials, Vol. 118 (Ed:, S. Volz,), Springer, Tokyo 2009, p. 469.
28. A. Dazzi, F. Glotin, R. Carminati, J. Appl. Phys. 2010, 107, 124519.
29. S. Sauvage, A. Driss, F. Reveret, P. Boucaud, A. Dazzi, R. Prazeres, F. Glotin, J. M. Ortega, A. Miard, Y. Halioua, F. Raineri, I. Sagnes, A. Lemaitre, Phys. Rev. B 2011, 83, 035302.
30. C. Mayet, A. Dazzi, R. Prazeres, E. Allot, E. Glotin, J. M. Ortega, Opt. Lett. 2008, 33, 1611.
31. L. J. Bellamy, The Infrared Spectra of Complex Molecules, John Wiley & Sons Inc., New York 1980.
32. R. T. Graf, J. L. Koenig, H. Ishida, Appl. Spectrosc. 1985, 39, 405.
33. a) N. J. Harrick, Internal Reflection Spectroscopy, Interscience Publishers, New York 1967
34. b) H. Hosono, J. Appl. Phys. 1991, 69, 8079.
35. L. A. Averett, P. R. Griffiths, K. Hishikida, Anal. Chem. 2008, 80, 3045.
36. J. W. Valvano, J. R. Cochran, K. R. Diller, Int. J. Thermophys. 1985, 6, 301.
37. I. Zein, D. W. Hutmacher, K. C. Tan, S. H. Teoh, Biomaterials 2002, 23, 1169.