Submicrometer infrared surface imaging using a scanning-probe microscope and an optical parametric oscillator laser

Optics Letters

Volumn 34, Issue 4, 2009, Pages 431-433

  Hill, Graeme A ^a   Rice, James H ^a,c   Meech, Stephen R ^a   Craig, Duncan Q M ^a   Kuo, Paulina ^b   Vodopyanov, Konstantin ^b   Reading, Michael ^a  

^a UNIVERSITY OF EAST ANGLIA   (United Kingdom)

^b STANFORD UNIVERSITY   (United States)

^c UNIVERSITY COLLEGE DUBLIN   (Ireland)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DIFFRACTION; IMAGE RESOLUTION; OPTICAL PARAMETRIC OSCILLATORS;

DETECTION MECHANISM; DIFFRACTION LIMITS; IR ABSORPTION; POLYSTYRENE BEADS; RESONANT OSCILLATION; SUBMICROMETERS; SURFACE IMAGING; TOPOGRAPHY IMAGES;

PARAMETRIC OSCILLATORS;

POLYSTYRENE DERIVATIVE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; EQUIPMENT DESIGN; INFRARED SPECTROPHOTOMETRY; INSTRUMENTATION; LASER; METHODOLOGY; MICROSCOPY; OPTICS; OSCILLOMETRY; RADIATION SCATTERING; REPRODUCIBILITY; SURFACE PROPERTY;

EQUIPMENT DESIGN; LASERS; MICROSCOPY; MICROSCOPY, ATOMIC FORCE; OPTICS AND PHOTONICS; OSCILLOMETRY; POLYSTYRENES; REPRODUCIBILITY OF RESULTS; SCATTERING, RADIATION; SPECTROPHOTOMETRY, INFRARED; SURFACE PROPERTIES;

EID: 60249103074     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.34.000431     Document Type: Article

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