Defect scaling with contact area in EGaIn-based junctions: Impact on quality, Joule heating, and apparent injection current

Journal of Physical Chemistry C

Volumn 119, Issue 2, 2015, Pages 960-969

  Jiang, Li ^a   Sangeeth, C S Suchand ^a   Wan, Albert ^a   Vilan, Ayelet ^b   Nijhuis, Christian A ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b WEIZMANN INSTITUTE OF SCIENCE   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

CURVE FITTING; ELECTRODES; EQUIPMENT TESTING; IMPURITIES; JOULE HEATING;

BOTTOM ELECTRODES; DECAY COEFFICIENTS; ELECTRICAL CHARACTERISTIC; ELECTRODE MATERIAL; INJECTION CURRENT DENSITY; INJECTION CURRENTS; ORDERS OF MAGNITUDE; TUNNELING JUNCTIONS;

DEFECTS;

EID: 84921306799     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp511002b     Document Type: Article

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