A molecular half-wave rectifier

Journal of the American Chemical Society

Volumn 133, Issue 39, 2011, Pages 15397-15411

  Nijhuis, Christian A ^a   Reus, William F ^b   Siegel, Adam C ^b   Whitesides, George M ^b  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b HARVARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AC CIRCUITS; AC MEASUREMENTS; AC SIGNALS; ALKANETHIOLS; ALTERNATING CURRENT; APPLIED BIAS; BOTTOM ELECTRODES; DC CIRCUITS; DIFFERENT MECHANISMS; DIRECT CURRENT; DIRECT TUNNELING; F-N TUNNELING; FERROCENYL; FORWARD BIAS; FOWLER-NORDHEIM TUNNELING; FUNCTIONAL ELEMENTS; HALF-WAVE; HALF-WAVE RECTIFIERS; LOW BIAS; RECTIFICATION RATIO; REVERSE BIAS; SAMS; SIMPLE CIRCUITS; TWO-REGIME; ULTRAFLAT;

ELECTRODES; FLASH MEMORY; GALLIUM; SELF ASSEMBLED MONOLAYERS;

ELECTRIC RECTIFIERS;

GALLIUM; INDIUM; SELF ASSEMBLED MONOLAYER;

ALTERNATING CURRENT; ARTICLE; DIRECT CURRENT; ELECTRODE; ELECTRON TRANSPORT; GAP JUNCTION; MOLECULAR DYNAMICS;

ALKANES; ELECTRIC CONDUCTIVITY; ELECTRICAL EQUIPMENT AND SUPPLIES; ELECTRODES; ELECTRON TRANSPORT; GALLIUM; INDIUM; SULFHYDRYL COMPOUNDS;

EID: 80053304733     PISSN: 00027863     EISSN: 15205126     Source Type: Journal    
DOI: 10.1021/ja201223n     Document Type: Article

References (55)

1. Nijhuis, C. A.; Reus, W. F.; Whitesides, G. M. J. Am. Chem. Soc. 2009, 31, 17816
2. Chiechi, R. C.; Weiss, E. A.; Dickey, M. D.; Whitesides, G. M. Angew. Chem., Int. Ed. 2008, 47, 142
3. Nijhuis, C. A.; Reus, W. F.; Whitesides, G. M. J. Am. Chem. Soc. 2010, 132, 18386
4. Aviram, A.; Ratner, M. A. Chem. Phys. Lett. 1974, 29, 277
5. Metzger, R. M. Acc. Chem. Res. 1999, 32, 950
6. Shumate, W. J.; Mattern, D. L.; Jaiswal, A.; Dixon, D. A.; White, T. R.; Burgess, J.; Honciuc, A.; Metzger, R. M. J. Phys. Chem. B 2006, 110, 11146
7. Ashwell, G. J.; Ewinton, J.; Robinson, B. J. Chem. Commun. 2006, 618
8. Ng, M.-K.; Lee, D.-C.; Yu, L. J. Am. Chem. Soc. 2002, 124, 11862
9. Peterson, I. R.; Vuillaume, D.; Metzger, R. M. J. Phys. Chem. A 2001, 105, 4702
10. Lenfant, S.; Krzeminski, C.; Delerue, C.; Allan, G.; Vuillaume, D. Nano Lett. 2003, 3, 741
11. Chabinyc, M. L.; Chen, X.; Holmlin, R. E.; Jacobs, H.; Skulason, H.; Frisbie, C. D.; Mujica, V.; Ratner, M. A.; Rampi, M. A.; Whitesides, G. M. J. Am. Chem. Soc. 2002, 124, 11730
12. Ashwell, G. J.; Urasinska-Wojcik, B.; Phillips, L. J. Angew. Chem., Int. Ed. 2010, 49, 3508
13. Gayathri, S. S.; Patnaik, A. Chem. Commun. 2006, 1977
14. Honciuc, A.; Jaiswal, A.; Gong, A.; Ashworth, K.; Spangler, C. W.; Peterson, I. R.; Dalton, L. R.; Metzger, R. M. J. Phys. Chem. B 2005, 109, 857
15. Chen, X.; Jeon, Y.-M.; Jang, J.-W.; Qin, L.; Huo, F.; Wei, W.; Mirkin, C. A. J. Am. Chem. Soc. 2008, 130, 8166
16. Böhme, T.; Simpson, C. D.; Müllen, K.; Rabe, J. P. Chem.-Eur. J. 2007, 13, 7349
17. Chen, X.; Jeon, Y.-M.; Jang, J.-W.; Qin, L.; Huo, F.; Wei, W.; Mirkin, C. A. J. Am. Chem. Soc. 2008, 130, 8166
18. Metzger, R. M.; Chen, B.; Ho1pfner, U.; Lakshmikantham, M. V.; Vuillaume, D.; Kawai, T.; Wu, X.; Tachibana, H.; Hughes, T. V.; Sakurai, H.; Baldwin, J. W.; Hosch, C.; Cava, M. P.; Brehmer, L.; Ashwell, G. J. J. Am. Chem. Soc. 1997, 119, 10455
19. Salomon, A.; Boecking, T.; Chan, C. K.; Amy, F.; Girshevitz, O.; Cahen, D.; Kahn, A. Phys. Rev. Lett. 2005, 95, 266807
20. Salomon, A.; Boecking, T.; Seitz, O.; Markus, T.; Amy, F.; Chan, C.; Zhao, W.; Cahen, D.; Kahn, A. Adv. Mater. 2007, 19, 445
21. Salomon, A.; Böcking, T.; Gooding, J. J.; Cahen, D. Nano Lett. 2006, 6, 2873
22. Bang, G. S.; Chang, H.; Koo, J.-R.; Lee, T.; Advincula, R. C.; Lee, H. Small 2008, 4, 1399
23. Kim, T.-W.; Wang, G.; Lee, H.; Lee, T. Nanotechnology 2007, 18, 315204
24. Lau, C. N.; Stewart, D. R; Williams, R. S.; Bockrath, M. Nano Lett. 2004, 4, 569
25. Bebee, J. M.; Kushmerick, J. G. Appl. Phys. Lett. 2007, 90, 083117
26. Walker, A. V.; Tighe, T. B.; Cabarcos, O. M.; Reinard, M. D.; Haynie, B. C.; Uppili, S.; Winograd, N.; Allara, D. L. J. Am. Chem. Soc. 2004, 126, 3954
27. We are preparing a manuscript that collects this evidence in one place, and provides additional evidence that we believe conclusively demonstrates the molecular origin of rectification in our diodes. Reus, W. F.; Thuo, M. M.; Nijhuis, C. A.; Shapiro, N.; Whitesides, G. M., unpublished material.
28. Pierce, D. G.; Brusius, P. G. Microelectron. Reliab. 1997, 37, 1053
29. Krumbein, S. J. IEEE Trans.Compds., Hybrids, Manuf. Technol. 1988, 11, 5
30. McCreery, R. L. Chem. Mater. 2004, 16, 4477
31. Nijhuis, C. A.; Reus, W. F.; Barber, J.; Dickey, M. D.; Whitesides, G. M. Nano Lett. 2010, 10, 3611
32. Barr, T. L.; Seal, S. J. Vac. Sci. Technol. A 1995, 13, 1239
33. Cademartiri, L.; Thuo, M. M.; Nijhuis, C. A.; Barber, J. R.; Sodhi, R. N. S.; Brodersen, P.; Kim, C.; Reus, W. F.; Chiechi, R. C.; Whitesides, G. M., unpublished results.
34. Reus, W. F.; Nijhuis, C. A.; Barber, J.; Thuo, M. M.; Cademartiri, L.; Kim, C.; York, R. L.; Liu, X.; Whitesides, G. M., unpublished results.
35. Lorenz, M. R.; Woods, J. F.; Gambino, R. J. J. Phys. Chem. Solids 1967, 28, 403
36. Li, C. P.; Wei, K. H.; Huang, J. Y. Angew. Chem., Int. Ed. 2006, 45, 1449
37. Kitagawa, K.; Morita, T.; Kimura, S. J Phys. Chem. B 2005, 109, 13906
38. Tivanski, A. V.; Walker, G. C. J. Am. Chem. Soc. 2005, 127, 7647
39. Müller-Meskamp, L.; Karthäuser, S.; Zandvliet, H. J. W.; Homberger, M.; Simon, U.; Waser, R. Small 2009, 5, 496
40. Liu, Y.; Offenhäusser, A.; Mayar, D. Phys. Status Solidi A 2010, 207, 891
41. Choi, S. H.; Kim, B. S.; Frisbie, C. F. Science 2008, 320, 1482
42. Beebe, J. M.; Kim, B.; Gadzuk, J. W.; Frisbie, D. C.; Kushmerick, J. G. Phys. Rev. Lett. 2006, 97, 026801
43. Beebe, J. M.; Kim, B. S.; Frisbie, D. C.; Kushmerick, J. G. ACS Nano 2008, 2, 827
44. Engelkes, V. B.; Beebe, J. M.; Frisbie, C. D. J. Am. Chem. Soc. 2004, 126, 14287
45. Lindsay, S. M.; Ratner, M. A. Adv. Mater. 2007, 19, 23
46. Simmons, J. G. J. Appl. Phys. 1963, 34, 1793
47. Simmons, J. G. J. Appl. Phys. 1963, 34, 2581
48. McConnell, H. M. J. Chem. Phys. 1961, 508, 515
49. Joachim, C.; Ratner, M. A. Proc. Natl. Acad. Sci. U.S.A. 2005, 102, 8801
50. Weiss, E. A.; Chiechi, R. C.; Kaufman, G. K.; Kriebel, J. K.; Li, Z.; Duati, M.; Rampi, M. A.; Whitesides, G. M. J. Am. Chem. Soc. 2007, 129, 4336
51. Love, J. C.; Estroff, L. A.; Kriebel, J. K.; Nuzzo, R. G.; Whitesides, G. M. Chem. Rev. 2005, 105, 1103
52. Dorf, R. C., Ed. The Electrical Engineering Handbook; CRC Press: Boca Raton, FL, 1993.
53. Paul, C. R. Fundamentals of Electric Circuit Analysis; John Wiley & Sons: New York, 2001.
54. Haag, R.; Rampi, M. A.; Holmlin, R. E.; Whitesides, G. M. J. Am. Chem. Soc. 1999, 121, 7895
55. McCreery, R. L.; Bergren, A. J. Adv. Mater. 2009, 21, 4303