Dependency of the tunneling decay coefficient in molecular tunneling junctions on the topography of the bottom electrodes

Angewandte Chemie - International Edition

Volumn 53, Issue 13, 2014, Pages 3377-3381

  Yuan, Li ^a   Jiang, Li ^a   Zhang, Bo ^a   Nijhuis, Christian A ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

bottom electrodes; charge transport; molecular electronics; self assembled monolayers; tunneling decay constant

Indexed keywords

CHARGE TRANSFER; ELECTRODES; GRAIN BOUNDARIES; MOLECULAR ELECTRONICS; SURFACE MEASUREMENT; TOPOGRAPHY;

BOTTOM ELECTRODES; DECAY COEFFICIENTS; DECAY CONSTANTS; MOLECULAR-TUNNELING JUNCTIONS; ROUGH SURFACES; SELF-ASSEMBLED; SMOOTH SURFACE; TUNNELING JUNCTIONS;

SELF ASSEMBLED MONOLAYERS;

EID: 84896444643     PISSN: 14337851     EISSN: 15213773     Source Type: Journal    
DOI: 10.1002/anie.201309506     Document Type: Article

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