Influence of defects on the electrical characteristics of mercury-drop junctions: Self-assembled monolayers of n-alkanethiolates on rough and smooth silver

Journal of the American Chemical Society

Volumn 129, Issue 14, 2007, Pages 4336-4349

  Weiss, Emily A ^a   Chiechi, Ryan C ^a   Kaufman, George K ^a   Kriebel, Jennah K ^a   Li, Zhefeng ^a   Duati, Marco ^b   Rampi, Maria A ^b   Whitesides, George M ^a  

^a HARVARD UNIVERSITY   (United States)

^b UNIVERSITY OF FERRARA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEPOSITION; ELECTRIC PROPERTIES; ELECTRON BEAMS; INFRARED SPECTROSCOPY; SILVER;

ELECTRON BEAM EVAPORATOR; MERCURY DROP JUNCTIONS; SILVER SUBSTRATES; TEMPLATE STRIPPING;

SELF ASSEMBLED MONOLAYERS;

ALKANE DERIVATIVE; MERCURY; SILVER; THIOL DERIVATIVE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL STRUCTURE; DENSITY; ELECTRIC ACTIVITY; ELECTRIC CURRENT; ELECTRODE; ELECTRON BEAM; INFRARED SPECTROSCOPY; THICKNESS;

EID: 34247127494     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja0677261     Document Type: Article

References (81)

1. Follonier, S.; Miller, W. J. W.; Abbott, N. L.; Knoesen, A. Langmuir 2003, 19, 10501.
2. Bertilsson, L.; Liedberg, B. Langmuir 1993, 9, 141.
3. Laibinis, P. E.; Whitesides, G. M.; Allara, D. L.; Tao, Y. T.; Parikh, A. N.; Nuzzo, R. G. J. Am. Chem. Soc. 1991, 113, 7152.
4. Gupta, P.; Ulman, A.; Fanfan, S.; Korniakov, A.; Loos, K. J. Am. Chem. Soc. 2005, 127, 4.
5. Levlin, M.; Laakso, A. Appl. Surf. Sci. 2001, 171, 257.
6. Dumont, J.; Wiame, F.; Ghijsen, J.; Sporken, R. Surf. Sci. 2004, 572, 459.
7. Gupta, P.; Loos, K.; Korniakov, A.; Spagnoli, C.; Cowman, M.; Ulman, A. Angew. Chem., Int. Ed. 2004, 43, 520.
8. Ragan, R.; Ohlberg, D.; Blackstock, J. J.; Kim, S.; Williams, R. S. J. Phys. Chem. B 2004, 108, 20187.
9. Samori, P.; Diebel, J.; Loewe, H.; Rabe, J. P. Langmuir 1999, 15, 2592.
10. Wagner, P.; Hegner, M.; Guntherodt, H.-J.; Semenza, G. Langmuir 1995, 11, 3867.
11. Naumann, R.; Schiller, S. M.; Gless, F.; Grohe, B.; Hartman, K. B.; Karcher, I.; Koper, I.; Lubben, J.; Vasilev, K.; Knoll, W. Langmuir 2003, 19, 5435.
12. Love, J. C.; Estroff, L. A.; Kriebel, J. K.; Nuzzo, R. G.; Whitesides, G. M. Chem. Rev. 2005, 105, 1103.
13. Yang, G.; Liu, G.-Y. J. Phys. Chem. B 2003, 107, 8746.
14. Poirier, G. E.; Pylant, E. D. Science 1996, 272, 1145.
15. Yamada, R.; Wano, H.; Uosaki, K. Langmuir 2000, 16, 5523.
16. Laffineur, F.; Couturier, N.; Delhalle, J.; Mekhalif, Z. Appl. Surf. Sci. 2003, 212-213, 452.
17. Selzer, Y.; Salomon, A.; Cahen, D. J. Am. Chem. Soc. 2002, 124, 2886.
18. Rampi, M. A.; Whitesides, G. M. Chem. Phys. 2002, 281, 373.
19. Tran, E.; Grave, C.; Whitesides, G. A.; Rampi, M. A. Electrochim. Acta 2005, 50, 4850.
20. Holmlin, R. E.; Ismagilov, R. F.; Haag, R.; Mujica, V.; Ratner, M. A.; Rampi, M. A.; Whitesides, G. M. Angew. Chem., Int. Ed. 2001, 40, 2316.
21. Holmlin, R. E.; Haag, R.; Chabinyc, M. L.; Ismagilov, R. F.; Cohen, A. E.; Terfort, A.; Rampi, M. A.; Whitesides, G. M. J. Am. Chem. Soc. 2001, 123, 5075.
22. Chung, C.; Lee, M. J. Electroanal. Chem. 1999, 468, 91.
23. Nishida, N.; Hara, M.; Sasabe, H.; Knoll, W. Jpn. J. Appl. Phys. Part 1 1997, 36, 2379.
24. Baralia Gabriel, G.; Duwez, A.-S.; Nysten, B.; Jonas Alain, M. Langmuir 2005, 21, 6825.
25. Lee, T.; Wang, W.; Klemic, J. F.; Zhang, J. J.; Su, J.; Reed, M. A. J. Phys. Chem. B 2004, 108, 8742.
26. Slowinski, K.; Chamberlain, R. V.; Miller, C. J.; Majda, M. J. Am. Chem. Soc. 1997, 119, 11910.
27. Salomon, A.; Cahen, D.; Lindsay, S.; Tomfohr, J.; Engelkes, V. B.; Frisbie, C. D. Adv. Mater. 2003, 15, 1881.
28. Bihary, Z.; Ratner, M. A. Phys. Rev. B 2005, 72, 115439/1.
29. Engelkes, V. B.; Beebe, J. M.; Frisbie, C. D. J. Am. Chem. Soc. 2004, 126, 14287.
30. The length (along the C-C backbone) of two trans-extended alkyl chains, each with n carbon atoms, whose terminal methyl groups associate at a van der Waals interface is ∼2.5 Å greater than that of one trans-extended alkyl chain with 2n carbon atoms.
31. Steiner, T.; Desiraju, G. R. Chem. Commun. 1998, 891.
32. Yamamoto, H.; Waldeck, D. H. J. Phys. Chem. B 2002, 106, 7469.
33. Magnussen, O. M.; Ocko, B. M.; Duetsch, M.; Regan, M. J.; Pershan, P. S.; Abernathy, D.; Gurebel, G.; Legrand, J.-F. Nature 1996, 384, 250.
34. Lavrich, D. J.; Wetterer, S. M.; Bernasek, S. L.; Scoles, G. J. Phys. Chem. B 1998, 102, 3456.
35. Demoz, A.; Harrison, D. J. Langmuir 1993, 9, 1046.
36. Beebe, J. M.; Engelkes, V. B.; Miller, L. L.; Frisbie, C. D. J. Am. Chem. Soc. 2002, 124, 11268.
37. Dunbar, T. D.; Cygan, M. T.; Bumm, L. A.; McCarty, G. S.; Burgin, T. P.; Reinerth, W. A.; Jones, L., II; Jackiw, J. J.; Tour, J. M.; Weiss, P. S.; Allara, D. L. J. Phys. Chem. B 2000, 104, 4880.
38. Dameron, A. A.; Ciszek, J. W.; Tour, J. M.; Weiss, P. S. J. Phys. Chem. B 2004, 108, 16761.
39. Xu, B.; Tao, N. J. Science 2003, 301, 1221.
40. Akkerman, H. B.; Blom, P. W. M.; de Leeuw, D. M.; de Boer, B. Nature 2006, 441, 69.
41. Wang, W. Y.; Lee, T.; Reed, M. A. J. Phys. Chem. B 2004, 108, 18398.
42. Haick, H.; Ambrico, M.; Ghabboun, J.; Ligonzo, T.; Cahen, D. Phys. Chem. Chem. Phys. 2004, 6, 4538.
43. Wang, W.; Lee, T.; Reed, M. A. Phys. Rev. B 2003, 68, 035416/1.
44. Chabinyc, M. L.; Chen, X. X.; Holmlin, R. E.; Jacobs, H.; Skulason, H.; Frisbie, C. D.; Mujica, V.; Ratner, M. A.; Rampi, M. A.; Whitesides, G. M. J. Am. Chem. Soc. 2002, 124, 11730.
45. Grave, C.; Tran, E.; Samori, P.; Whitesides, G. M.; Rampi, M. A. Synth. Met. 2004, 147, 11.
46. Slowinski, K.; Slowinska, K. U.; Majda, M. J. Phys. Chem. B 1999, 103, 8544.
47. Salomon, A.; Arad-Yellin, R.; Shanzer, A.; Karton, A.; Cahen, D. J. Am. Chem. Soc. 2004, 126, 11648.
48. Galperin, M.; Nitzan, A.; Sek, S.; Majda, M. J. Electroanal. Chem. 2003, 550-551, 337.
49. Slowinski, K.; Majda, M. J. Electroanal. Chem. 2000, 491, 139.
50. Ocko, B. M.; Kraack, H.; Pershan, P. S.; Sloutskin, E.; Tamam, L.; Deutsch, M. Phys. Rev. Lett. 2005, 94, 017802.
51. Sek, S.; Bilewicz, R.; Slowinski, K. Chem. Commun. 2004, 404.
52. York, R. L.; Nguyen, P. T.; Slowinski, K. J. Am. Chem. Soc. 2003, 125, 5948.
53. York, R. L.; Nacionales, D.; Slowinski, K. Chem. Phys. 2005, 319.
54. Slowinski, K.; Fong, H. K. Y.; Majda, M. J. Am. Chem. Soc. 1999, 121, 7257.
55. 18, which are more crystalline and probably more brittle and subject to fracture into plates, rather than simple lateral spreading).
56. 12 electrode) will, therefore, conform to some changes in the topography of the silver film but will not conform to others.
57. Ulman, A. Chem. Rev. 1996, 96, 1533.
58. Hegner, M.; Wagner, P.; Semenza, G. Surf Sci. 1993, 291, 39.
59. Weiss, E. A.; Kaufman, G. K.; Kriebel, J. K.; Li, Z.; Schaleck, R.; Whitesides, G. M., submitted to Langmuir.
60. Azzaroni, O.; Vela, M. E.; Andreasen, G.; Carro, P.; Salvarezza, R. C. J. Phys. Chem. B 2002, 106, 12267.
61. Diebel, J.; Lowe, H.; Samori, P.; Rabe, J. P. J. Appl. Phys. A 2001, 73, 273.
62. Porter, M. D.; Bright, T. B.; Allara, D. L.; Chidsey, C. E. D. J. Am. Chem. Soc. 1987, 109, 3559.
63. Blackstock, J. J.; Li, Z.; Stewart, D. R.; Isaacson, K.; Kwok, D. Y.; Freeman, M. R.; Green, J.-B., unpublished work.
64. -1, due to Fermi resonance interactions with a low-frequency asymmetric methyl deformation mode.
65. Dubois, L. H.; Nuzzo, R. G. Annu. Rev. Phys. Chem. 1992, 43, 437.
66. Zhang, M.; Anderson, M. R. Langmuir 1994, 10, 2807.
67. 2) in a thiol solution and allowing the silver to cleave from the template as the SAM forms [Weiss, E. A.; Kaufman, G. K.; Kriebel, J. K.; Li, Z.; Schaleck, R.; Whitesides, G. M., submitted to Langmuir].
68. Haynie, B. C.; Walker, A. V.; Tighe, T. B.; Allara, D. L.; Winograd, N. Appl. Surf. Sci. 2003, 433, 203.
69. Calleja, M.; Tello, M.; Anguita, J.; Garcia, F.; Garcia, R. Appl. Phys. Lett. 2001, 79, 2471.
70. Mehrez, H.; Wlasenko, A.; Larade, B.; Taylor, J.; Grutter, P.; Guo, H. Phys. Rev. B 2002, 65.
71. Park, H.; Lim, A. K. L.; Alivisatos, A. P.; Park, J.; McEuen, P. L. Appl. Phys. Lett. 1999, 75, 301.
72. Park, S. H.; Barish, R.; Li, H.; Reif, J. H.; Finkelstein, G.; Yan, H.; LaBean, T. H. Nano Lett. 2005, 5, 693.
73. Mozos, J. L.; Ordejon, P.; Brandbyge, M.; Taylor, J.; Stokbro, K. Nanotechnology 2002, 13, 346.
74. Hoogvliet, J. C.; van Bennekom, W. P. Electrochim. Acta 2001, 47, 599.
75. Hieber, H. Thin Solid Films 1976, 37, 335.
76. In general, the assembly of a SAM involves a dynamic exchange between adsorbates on the surface and their precursors in free solution [Love, J. C.; Estroff, L. A.; Kriebel, J. K.; Nuzzo, R. G.; Whitesides, G. M. Chem. Rev. 2005, 105, 1103]. The composition of a SAM reflects (i) the concentration of the adsorbate species present in the solution, (ii) the strength of the intermolecular interactions among adsorbate species in solution and in the SAM, (iii) the strength of the bond between the adsorbate molecule and the metal surface, and (iv) the presence of kinetically trapped defects and disorder in the array reflecting inevitable entropic disorder.
77. Bucher, J.-P.; Santesson, L.; Kern, K. Langmuir 1994, 10, 979.
78. Dhirani, A.; Hines, M. A.; Fisher, A. J.; Ismail, O.; Guyot-Sionnest, P. Langmuir 1995, 11, 2609.
79. Engelkes, V. B.; Beebe, J. M.; Frisbie, C. D. J. Phys. Chem. B 2005, 109, 16801.
80. We observed no correlation between the area of the junction and the magnitude of the current for the TS junctions, possibly because we varied the area of the junction by no more than a factor of 4 (and usually by only a factor of 2), and there was no guarantee that the distribution of defects within every junction was similar.
81. 2) or thermally annealing before formation of the SAM.