Contact resistance in metal-molecule-metal junctions based on aliphatic SAMs: Effects of surface linker and metal work function

Journal of the American Chemical Society

Volumn 124, Issue 38, 2002, Pages 11268-11269

  Beebe, Jeremy M ^a   Engelkes, Vincent B ^a   Miller, Larry L ^a   Frisbie, C Daniel ^a  

^a UNIVERSITY OF MINNESOTA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

METAL;

ARTICLE; ATOMIC FORCE MICROSCOPY; ELECTRIC POTENTIAL; MOLECULAR INTERACTION; SURFACE PROPERTY;

EID: 0037174406     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja0268332     Document Type: Article

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