Charge transport and rectification in arrays of SAM-based tunneling junctions

Nano Letters

Volumn 10, Issue 9, 2010, Pages 3611-3619

  Nijhuis, Christian A ^a   Reus, William F ^a   Barber, Jabulani R ^a   Dickey, Michael D ^a   Whitesides, George M ^a  

^a HARVARD UNIVERSITY   (United States)

Author keywords

charge transfer; charge transport; molecular electronics; Nanoelectronics; rectification; self assembled monolayers

Indexed keywords

ALKANETHIOLATES; CHARGE TRANSPORT; CHARGE TRANSPORT PROCESS; CHEMICAL STRUCTURE; ELECTRICAL CHARACTERISTIC; EXPERIMENTAL MEASUREMENTS; FERROCENES; FERROCENYL; RECTIFICATION; RECTIFICATION RATIO; SAMS; TUNNELING JUNCTIONS; ULTRAFLAT;

CHARGE TRANSFER; ELECTRODES; ION EXCHANGE; IRON COMPOUNDS; MASS TRANSFER; MOLECULAR ELECTRONICS; NANOELECTRONICS;

SELF ASSEMBLED MONOLAYERS;

ARTICLE; MICROFLUIDICS; NANOTECHNOLOGY;

MICROFLUIDICS; NANOTECHNOLOGY;

EID: 77956420967     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl101918m     Document Type: Article

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