-
1
-
-
0012618901
-
Atomic Force Microscope
-
Binnig, G., Quate, C. F., and Gerber, C., “Atomic Force Microscope,” Physical Review Letters, Vol. 56, No. 9, pp. 930–933, 1986.
-
(1986)
Physical Review Letters
, vol.56
, Issue.9
, pp. 930-933
-
-
Binnig, G.1
Quate, C.F.2
Gerber, C.3
-
2
-
-
0042565700
-
Micro/Nano-Tribological Characteristics of Self-Assembled Monolayer and Its Application in Nano-Structure Fabrication
-
Sung, I. H., Yang, J. C., Kim, D. E., and Shin, B. S., “Micro/Nano-Tribological Characteristics of Self-Assembled Monolayer and Its Application in Nano-Structure Fabrication,” Wear, Vol. 255, No. 7, pp. 808–818, 2003.
-
(2003)
Wear
, vol.255
, Issue.7
, pp. 808-818
-
-
Sung, I.H.1
Yang, J.C.2
Kim, D.E.3
Shin, B.S.4
-
3
-
-
48049116880
-
Nanolithography and Manipulation of Graphene using an Atomic Force Microscope
-
Giesbers, A. J. M., Zeitler, U., Neubeck, S., Freitag, F., Novoselov, K., and Maan, J., “Nanolithography and Manipulation of Graphene using an Atomic Force Microscope,” Solid State Communications, Vol. 147, No. 9, pp. 366–369, 2008.
-
(2008)
Solid State Communications
, vol.147
, Issue.9
, pp. 366-369
-
-
Giesbers, A.J.M.1
Zeitler, U.2
Neubeck, S.3
Freitag, F.4
Novoselov, K.5
Maan, J.6
-
4
-
-
6144290977
-
Thermomechanical Writing with an Atomic Force Microscope Tip
-
Mamin, H. J. and Rugar, D., “Thermomechanical Writing with an Atomic Force Microscope Tip,” Applied Physics Letters, Vol. 61, No. 8, pp. 1003–1005, 1992.
-
(1992)
Applied Physics Letters
, vol.61
, Issue.8
, pp. 1003-1005
-
-
Mamin, H.J.1
Rugar, D.2
-
5
-
-
0012986514
-
Atomic Force Microscope-based Data Storage: Track Servo and Wear Study
-
Terris, B. D., Rishton, S. A., Mamin, H. J., Ried, R. P., and Rugar, D., “Atomic Force Microscope-based Data Storage: Track Servo and Wear Study,” Applied Physics A: Materials Science & Processing, Vol. 66, No. 1, pp. S809–S813, 1998.
-
(1998)
Applied Physics A: Materials Science & Processing
, vol.66
, Issue.1
, pp. S809-S813
-
-
Terris, B.D.1
Rishton, S.A.2
Mamin, H.J.3
Ried, R.P.4
Rugar, D.5
-
6
-
-
44449150403
-
-
Bhushan, B. and Kwak, K. J., “Noble Metal-Coated Probes Sliding at up to 100 mm s-1 Against PZT Films for AFM Probe-based Ferroelectric Recording Technology,” Journal of Physics: Condensed Matter, Vol. 20, No. 22, Paper No. 225013, 2008.
-
(2008)
Journal of Physics: Condensed Matter
, vol.20
, Issue.22
-
-
-
7
-
-
0000406346
-
Machining Oxide Thin Films with an Atomic Force Microscope: Pattern and Object Formation on the Nanometer Scale
-
Kim, Y., and Lieber, C. M., “Machining Oxide Thin Films with an Atomic Force Microscope: Pattern and Object Formation on the Nanometer Scale,” Science, Vol. 257, No. 5068, pp. 375–377, 1992.
-
(1992)
Science
, vol.257
, Issue.5068
, pp. 375-377
-
-
Kim, Y.1
Lieber, C.M.2
-
8
-
-
36449009033
-
Fabrication of TwoDimensional Arrays of NanometerSize Clusters with the Atomic Force Microscope
-
Schaefer, D. M., Reifenberger, R., Patil, A., and Andres, R. P., “Fabrication of TwoDimensional Arrays of NanometerSize Clusters with the Atomic Force Microscope,” Applied Physics Letters, Vol. 66, No. 8, pp. 1012–1014, 1995.
-
(1995)
Applied Physics Letters
, vol.66
, Issue.8
, pp. 1012-1014
-
-
Schaefer, D.M.1
Reifenberger, R.2
Patil, A.3
Andres, R.P.4
-
9
-
-
33646020666
-
Contact Mechanics and Tip Shape in AFM-based Nanomechanical Measurements
-
Kopycinska-Müller, M., Geiss, R. H., and Hurley, D. C., “Contact Mechanics and Tip Shape in AFM-based Nanomechanical Measurements,” Ultramicroscopy, Vol. 106, No. 6, pp. 466–474, 2006.
-
(2006)
Ultramicroscopy
, vol.106
, Issue.6
, pp. 466-474
-
-
Kopycinska-Müller, M.1
Geiss, R.H.2
Hurley, D.C.3
-
10
-
-
0029639813
-
Device Fabrication by Scanned Probe Oxidation
-
Dagata, J. A., “Device Fabrication by Scanned Probe Oxidation,” Science, Vol. 270, No. 5242, pp. 1625–1625, 1995.
-
(1995)
Science
, vol.270
, Issue.5242
, pp. 1625
-
-
Dagata, J.A.1
-
11
-
-
0037816702
-
Voltage Modulation Scanned Probe Oxidation
-
Pérez-Murano, F., Birkelund, K., Morimoto, K., and Dagata, J. A., “Voltage Modulation Scanned Probe Oxidation,” Applied Physics Letters, Vol. 75, No. 2, pp. 199–201, 1999.
-
(1999)
Applied Physics Letters
, vol.75
, Issue.2
, pp. 199-201
-
-
Pérez-Murano, F.1
Birkelund, K.2
Morimoto, K.3
Dagata, J.A.4
-
12
-
-
0000199962
-
The Wear of Metals under Unlubricated Conditions
-
Archard, J. F. and Hirst, W., “The Wear of Metals under Unlubricated Conditions,” Proceedings of the Royal Society of London. Series A. Mathematical, Physical & Engineering Sciences, Vol. 236, No. 1206, pp. 397–410, 1956.
-
(1956)
Proceedings of the Royal Society of London. Series A. Mathematical, Physical & Engineering Sciences
, vol.236
, Issue.1206
, pp. 397-410
-
-
Archard, J.F.1
Hirst, W.2
-
14
-
-
70350484307
-
An AFM Study of Single-Contact Abrasive Wear: The Rabinowicz Wear Equation Revisited
-
Colaço, R., “An AFM Study of Single-Contact Abrasive Wear: The Rabinowicz Wear Equation Revisited,” Wear, Vol. 267, No. 11, pp. 1772–1776, 2009.
-
(2009)
Wear
, vol.267
, Issue.11
, pp. 1772-1776
-
-
Colaço, R.1
-
15
-
-
54149098334
-
Liquid-Like Tribology of Gold Studied by in Situ TEM
-
Merkle, A. P. and Marks, L. D., “Liquid-Like Tribology of Gold Studied by in Situ TEM,” Wear, Vol. 265, No. 11, pp. 1864–1869, 2008.
-
(2008)
Wear
, vol.265
, Issue.11
, pp. 1864-1869
-
-
Merkle, A.P.1
Marks, L.D.2
-
16
-
-
78651446207
-
-
Filippov, A. E., Popov, V. L., and Urbakh, M., “Mechanism of Wear and Ripple Formation Induced by the Mechanical Action of an Atomic Force Microscope Tip,” Physical Review Letters, Vol. 106, No. 2, Paper No. 025502, 2011.
-
(2011)
Physical Review Letters
, vol.106
, Issue.2
-
-
-
17
-
-
84870552151
-
Nano-Scale Wear: A Review
-
Kim, H. J., Yoo, S. S., and Kim, D. E., “Nano-Scale Wear: A Review,” Int. J. Precis. Eng. Manuf., Vol. 13, No. 9, pp. 1709–1718, 2012.
-
(2012)
Int. J. Precis. Eng. Manuf.
, vol.13
, Issue.9
, pp. 1709-1718
-
-
Kim, H.J.1
Yoo, S.S.2
Kim, D.E.3
-
18
-
-
40249101759
-
Nanoscale Friction and Wear Maps
-
Tambe, N. S. and Bhushan, B., “Nanoscale Friction and Wear Maps,” Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences, Vol. 366, No. 1869, pp. 1405–1424, 2008.
-
(2008)
Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences
, vol.366
, Issue.1869
, pp. 1405-1424
-
-
Tambe, N.S.1
Bhushan, B.2
-
19
-
-
77952760920
-
Microfabrication of Cantilever Styli for the Atomic Force Microscope
-
Albrecht, T. R., Akamine, S., Carver, T. E., and Quate, C. F., “Microfabrication of Cantilever Styli for the Atomic Force Microscope,” Journal of Vacuum Science & Technology A, Vol. 8, No. 4, pp. 3386–3396, 1990.
-
(1990)
Journal of Vacuum Science & Technology A
, vol.8
, Issue.4
, pp. 3386-3396
-
-
Albrecht, T.R.1
Akamine, S.2
Carver, T.E.3
Quate, C.F.4
-
20
-
-
84881605956
-
Micromachined Silicon Sensors for Scanning Force Microscopy
-
Wolter, O., Bayer, T., and Greschner, J., “Micromachined Silicon Sensors for Scanning Force Microscopy,” Journal of Vacuum Science & Technology B, Vol. 9, No. 2, pp. 1353–1357, 1991.
-
(1991)
Journal of Vacuum Science & Technology B
, vol.9
, Issue.2
, pp. 1353-1357
-
-
Wolter, O.1
Bayer, T.2
Greschner, J.3
-
21
-
-
36549100947
-
Formation of Silicon Tips with < 1 nm Radius
-
Marcus, R., Ravi, T., Gmitter, T., Chin, K., Liu, D., et al., “Formation of Silicon Tips with < 1 nm Radius,” Applied Physics Letters, Vol. 56, No. 3, pp. 236–238, 1990.
-
(1990)
Applied Physics Letters
, vol.56
, Issue.3
, pp. 236-238
-
-
Marcus, R.1
Ravi, T.2
Gmitter, T.3
Chin, K.4
Liu, D.5
-
22
-
-
0000872052
-
Oxidation Sharpening of Silicon Tips
-
Ravi, T., Marcus, R., and Liu, D., “Oxidation Sharpening of Silicon Tips,” Journal of Vacuum Science & Technology B, Vol. 9, No. 6, pp. 2733–2737, 1991.
-
(1991)
Journal of Vacuum Science & Technology B
, vol.9
, Issue.6
, pp. 2733-2737
-
-
Ravi, T.1
Marcus, R.2
Liu, D.3
-
23
-
-
0031375069
-
Microfabrication of Oxidation-Sharpened Silicon Tips on Silicon Nitride Cantilevers for Atomic Force Microscopy
-
Folch, A., Wrighton, M. S., and Schmidt, M. A., “Microfabrication of Oxidation-Sharpened Silicon Tips on Silicon Nitride Cantilevers for Atomic Force Microscopy,” Journal of Microelectromechanical Systems, Vol. 6, No. 4, pp. 303–306, 1997.
-
(1997)
Journal of Microelectromechanical Systems
, vol.6
, Issue.4
, pp. 303-306
-
-
Folch, A.1
Wrighton, M.S.2
Schmidt, M.A.3
-
24
-
-
0006316350
-
Characterization of Tips for Conducting Atomic Force Microscopy in Ultrahigh Vacuum
-
Lantz, M. A., O’Shea, S. J., and Welland, M. E., “Characterization of Tips for Conducting Atomic Force Microscopy in Ultrahigh Vacuum,” Review of Scientific Instruments, Vol. 69, No. 4, pp. 1757–1764, 1998.
-
(1998)
Review of Scientific Instruments
, vol.69
, Issue.4
, pp. 1757-1764
-
-
Lantz, M.A.1
O’Shea, S.J.2
Welland, M.E.3
-
25
-
-
0742267879
-
Fundamental Investigation of Micro Wear Rate using an Atomic Force Microscope
-
Chung, K. H. and Kim, D. E., “Fundamental Investigation of Micro Wear Rate using an Atomic Force Microscope,” Tribology Letters, Vol. 15, No. 2, pp. 135–144, 2003.
-
(2003)
Tribology Letters
, vol.15
, Issue.2
, pp. 135-144
-
-
Chung, K.H.1
Kim, D.E.2
-
26
-
-
14544289101
-
Tribological Characteristics of Probe Tip and PZT Media for AFM-based Recording Technology
-
Chung, K. H., Lee, Y. H., Kim, D. E., Yoo, J., and Hong, S., “Tribological Characteristics of Probe Tip and PZT Media for AFM-based Recording Technology,” IEEE Transactions on Magnetics, Vol. 41, No. 2, pp. 849–854, 2005.
-
(2005)
IEEE Transactions on Magnetics
, vol.41
, Issue.2
, pp. 849-854
-
-
Chung, K.H.1
Lee, Y.H.2
Kim, D.E.3
Yoo, J.4
Hong, S.5
-
27
-
-
52149095828
-
Wear of Si Cantilever Tips used in Atomic Force Acoustic Microscopy
-
Geiss, R. H., Kopycinska-Müller, M., and Hurley, D. C., “Wear of Si Cantilever Tips used in Atomic Force Acoustic Microscopy,” Microscopy and Microanalysis, Vol. 11, No. S02, pp. 364–365, 2005.
-
(2005)
Microscopy and Microanalysis
, vol.11
, Issue.S02
, pp. 364-365
-
-
Geiss, R.H.1
Kopycinska-Müller, M.2
Hurley, D.C.3
-
28
-
-
10044257453
-
Characteristics of Fracture during the Approach Process and Wear Mechanism of a Silicon AFM Tip
-
Chung, K. H., Lee, Y. H., and Kim, D. E., “Characteristics of Fracture during the Approach Process and Wear Mechanism of a Silicon AFM Tip,” Ultramicroscopy, Vol. 102, No. 2, pp. 161–171, 2005.
-
(2005)
Ultramicroscopy
, vol.102
, Issue.2
, pp. 161-171
-
-
Chung, K.H.1
Lee, Y.H.2
Kim, D.E.3
-
29
-
-
35348992728
-
Wear Characteristics of Diamond-Coated Atomic Force Microscope Probe
-
Chung, K. H. and Kim, D. E., “Wear Characteristics of Diamond-Coated Atomic Force Microscope Probe,” Ultramicroscopy, Vol. 108, No. 1, pp. 1–10, 2007.
-
(2007)
Ultramicroscopy
, vol.108
, Issue.1
, pp. 1-10
-
-
Chung, K.H.1
Kim, D.E.2
-
30
-
-
78049334941
-
An Ultraclean Tip-Wear Reduction Scheme for Ultrahigh Density Scanning Probe-based Data Storage
-
Tayebi, N., Zhang, Y., Chen, R. J., Tran, Q., Chen, R., et al., “An Ultraclean Tip-Wear Reduction Scheme for Ultrahigh Density Scanning Probe-based Data Storage,” ACS Nano, Vol. 4, No. 10, pp. 5713–5720, 2010.
-
(2010)
ACS Nano
, vol.4
, Issue.10
, pp. 5713-5720
-
-
Tayebi, N.1
Zhang, Y.2
Chen, R.J.3
Tran, Q.4
Chen, R.5
-
31
-
-
77955548449
-
Wear-Resistant Diamond Nanoprobe Tips with Integrated Silicon Heater for Tip-based Nanomanufacturing
-
Fletcher, P. C., Felts, J. R., Dai, Z., Jacobs, T. D., Zeng, H., et al., “Wear-Resistant Diamond Nanoprobe Tips with Integrated Silicon Heater for Tip-based Nanomanufacturing,” ACS Nano, Vol. 4, No. 6, pp. 3338–3344, 2010.
-
(2010)
ACS Nano
, vol.4
, Issue.6
, pp. 3338-3344
-
-
Fletcher, P.C.1
Felts, J.R.2
Dai, Z.3
Jacobs, T.D.4
Zeng, H.5
-
32
-
-
84859862599
-
Wear Resistant Nanoscale Silicon Carbide Tips for Scanning Probe Applications
-
Lantz, M. A., Gotsmann, B., Jaroenapibal, P., Jacobs, T. D., O’Connor, S. D., et al., “Wear Resistant Nanoscale Silicon Carbide Tips for Scanning Probe Applications,” Advanced Functional Materials, Vol. 22, No. 8, pp. 1639–1645, 2012.
-
(2012)
Advanced Functional Materials
, vol.22
, Issue.8
, pp. 1639-1645
-
-
Lantz, M.A.1
Gotsmann, B.2
Jaroenapibal, P.3
Jacobs, T.D.4
O’Connor, S.D.5
-
33
-
-
84873570532
-
Nanoscale Wear as a Stress-Assisted Chemical Reaction
-
Jacobs, T. D. and Carpick, R. W., “Nanoscale Wear as a Stress-Assisted Chemical Reaction,” Nature Nanotechnology, Vol. 8, No. 2, pp. 108–112, 2013.
-
(2013)
Nature Nanotechnology
, vol.8
, Issue.2
, pp. 108-112
-
-
Jacobs, T.D.1
Carpick, R.W.2
-
34
-
-
0029347143
-
Wear of the Atomic Force Microscope Tip under Light Load, Studied by Atomic Force Microscopy
-
Khurshudov, A. and Kato, K., “Wear of the Atomic Force Microscope Tip under Light Load, Studied by Atomic Force Microscopy,” Ultramicroscopy, Vol. 60, No. 1, pp. 11–16, 1995.
-
(1995)
Ultramicroscopy
, vol.60
, Issue.1
, pp. 11-16
-
-
Khurshudov, A.1
Kato, K.2
-
35
-
-
0000668985
-
Nano-Wear of the Diamond AFM Probing Tip under Scratching of Silicon, Studied by AFM
-
Khurshudov, A. G., Kato, K., and Koide, H., “Nano-Wear of the Diamond AFM Probing Tip under Scratching of Silicon, Studied by AFM,” Tribology Letters, Vol. 2, No. 4, pp. 345–354, 1996.
-
(1996)
Tribology Letters
, vol.2
, Issue.4
, pp. 345-354
-
-
Khurshudov, A.G.1
Kato, K.2
Koide, H.3
-
36
-
-
0033115617
-
Deformation and Wear of Pyramidal, Silicon-Nitride AFM Tips Scanning Micrometre-Size Features in Contact Mode
-
Bloo, M. L., Haitjema, H., and Pril, W. O., “Deformation and Wear of Pyramidal, Silicon-Nitride AFM Tips Scanning Micrometre-Size Features in Contact Mode,” Measurement, Vol. 25, No. 3, pp. 203–211, 1999.
-
(1999)
Measurement
, vol.25
, Issue.3
, pp. 203-211
-
-
Bloo, M.L.1
Haitjema, H.2
Pril, W.O.3
-
37
-
-
18744413294
-
Single Asperity Tribochemical Wear of Silicon Nitride Studied by Atomic Force Microscopy
-
Maw, W., Stevens, F., Langford, S. C., and Dickinson, J. T., “Single Asperity Tribochemical Wear of Silicon Nitride Studied by Atomic Force Microscopy,” Journal of Applied Physics, Vol. 92, No. 9, pp. 5103–5109, 2002.
-
(2002)
Journal of Applied Physics
, vol.92
, Issue.9
, pp. 5103-5109
-
-
Maw, W.1
Stevens, F.2
Langford, S.C.3
Dickinson, J.T.4
-
38
-
-
8744234038
-
Algorithm for Scanned Probe Microscope Image Simulation, Surface Reconstruction, and Tip Estimation
-
Villarrubia, J. S., “Algorithm for Scanned Probe Microscope Image Simulation, Surface Reconstruction, and Tip Estimation,” Journal of Research-National Institute of Standards and Technology, Vol. 102, No. 4, pp. 425–454, 1997.
-
(1997)
Journal of Research-National Institute of Standards and Technology
, vol.102
, Issue.4
, pp. 425-454
-
-
Villarrubia, J.S.1
-
39
-
-
56149106405
-
Blind Estimation of General Tip Shape in AFM Imaging
-
Tian, F., Qian, X., and Villarrubia, J., “Blind Estimation of General Tip Shape in AFM Imaging,” Ultramicroscopy, Vol. 109, No. 1, pp. 44–53, 2008.
-
(2008)
Ultramicroscopy
, vol.109
, Issue.1
, pp. 44-53
-
-
Tian, F.1
Qian, X.2
Villarrubia, J.3
-
40
-
-
0034333406
-
Experimental Test of Blind Tip Reconstruction for Scanning Probe Microscopy
-
Dongmo, L. S., Villarrubia, J. S., Jones, S. N., Renegar, T. B., Postek, M. T., and Song, J. F., “Experimental Test of Blind Tip Reconstruction for Scanning Probe Microscopy,” Ultramicroscopy, Vol. 85, No. 3, pp. 141–153, 2000.
-
(2000)
Ultramicroscopy
, vol.85
, Issue.3
, pp. 141-153
-
-
Dongmo, L.S.1
Villarrubia, J.S.2
Jones, S.N.3
Renegar, T.B.4
Postek, M.T.5
Song, J.F.6
-
41
-
-
77955536815
-
Method for Characterizing Nanoscale Wear of Atomic Force Microscope Tips
-
Liu, J., Notbohm, J. K., Carpick, R. W., and Turner, K. T., “Method for Characterizing Nanoscale Wear of Atomic Force Microscope Tips,” ACS Nano, Vol. 4, No. 7, pp. 3763–3772, 2010.
-
(2010)
ACS Nano
, vol.4
, Issue.7
, pp. 3763-3772
-
-
Liu, J.1
Notbohm, J.K.2
Carpick, R.W.3
Turner, K.T.4
-
42
-
-
77952706895
-
Preventing Nanoscale Wear of Atomic Force Microscopy Tips through the Use of Monolithic Ultrananocrystalline Diamond Probes
-
Liu, J., Grierson, D. S. Moldovan, N., Notbohm, J., Li, S., et al., “Preventing Nanoscale Wear of Atomic Force Microscopy Tips through the Use of Monolithic Ultrananocrystalline Diamond Probes,” Small, Vol. 6, No. 10, pp. 1140–1149, 2010.
-
(2010)
Small
, vol.6
, Issue.10
, pp. 1140-1149
-
-
Liu, J.1
Grierson, D.S.2
Moldovan, N.3
Notbohm, J.4
Li, S.5
-
43
-
-
84890059511
-
Fundamental Investigation of the Wear Progression of Silicon Atomic Force Microscope Probes
-
Chung, K. H., Lee, Y. H., Kim, H. J., and Kim, D. E., “Fundamental Investigation of the Wear Progression of Silicon Atomic Force Microscope Probes,” Tribology Letters, Vol. 52, No. 2, pp. 315–325, 2013.
-
(2013)
Tribology Letters
, vol.52
, Issue.2
, pp. 315-325
-
-
Chung, K.H.1
Lee, Y.H.2
Kim, H.J.3
Kim, D.E.4
-
44
-
-
0000469962
-
Surface Energy and the Contact of Elastic Solids
-
Johnson, K. L., Kendall, K., and Roberts, A. D., “Surface Energy and the Contact of Elastic Solids,” Proceedings of the Royal Society of London. A. Mathematical, Physical & Engineering Sciences, Vol. 324, No. 1558, pp. 301–313, 1971.
-
(1971)
Proceedings of the Royal Society of London. A. Mathematical, Physical & Engineering Sciences
, vol.324
, Issue.1558
, pp. 301-313
-
-
Johnson, K.L.1
Kendall, K.2
Roberts, A.D.3
-
45
-
-
33244484721
-
Effect of Contact Deformations on the Adhesion of Particles
-
Derjaguin, B. V., Muller, V. M., and Toporov, Y. P., “Effect of Contact Deformations on the Adhesion of Particles,” Journal of Colloid and Interface Science, Vol. 53, No. 2, pp. 314–326, 1975.
-
(1975)
Journal of Colloid and Interface Science
, vol.53
, Issue.2
, pp. 314-326
-
-
Derjaguin, B.V.1
Muller, V.M.2
Toporov, Y.P.3
-
46
-
-
0020804837
-
On Two Methods of Calculation of the Force of Sticking of an Elastic Sphere to a Rigid Plane
-
Muller, V. M., Derjaguin, B. V., and Toporov, Y. P., “On Two Methods of Calculation of the Force of Sticking of an Elastic Sphere to a Rigid Plane,” Colloids and Surfaces, Vol. 7, No. 3, pp. 251–259, 1983.
-
(1983)
Colloids and Surfaces
, vol.7
, Issue.3
, pp. 251-259
-
-
Muller, V.M.1
Derjaguin, B.V.2
Toporov, Y.P.3
-
47
-
-
33751360590
-
Adhesion of Spheres: The JKR-DMT Transition using a Dugdale Model
-
Maugis, D., “Adhesion of Spheres: The JKR-DMT Transition using a Dugdale Model,” Journal of Colloid and Interface Science, Vol. 150, No. 1, pp. 243–269, 1992.
-
(1992)
Journal of Colloid and Interface Science
, vol.150
, Issue.1
, pp. 243-269
-
-
Maugis, D.1
-
48
-
-
52149108043
-
-
Gotsmann, B. and Lantz, M. A., “Atomistic Wear in a Single Asperity Sliding Contact,” Physical Review Letters, Vol. 101, No. 12, Paper No. 125501, 2008.
-
(2008)
Physical Review Letters
, vol.101
, Issue.12
-
-
-
49
-
-
79954457495
-
Continuous Measurement of Atomic Force Microscope Tip Wear by Contact Resonance Force Microscopy
-
Killgore, J. P., Geiss, R. H., and Hurley, D. C., “Continuous Measurement of Atomic Force Microscope Tip Wear by Contact Resonance Force Microscopy,” Small, Vol. 7, No. 8, pp. 1018–1022, 2011.
-
(2011)
Small
, vol.7
, Issue.8
, pp. 1018-1022
-
-
Killgore, J.P.1
Geiss, R.H.2
Hurley, D.C.3
-
50
-
-
0017005646
-
Quasi-Static Solid Particle Damage in Brittle Solids — I. Observations Analysis and Implications
-
Evans, A. G. And Wilshaw, T. R., “Quasi-Static Solid Particle Damage in Brittle Solids — I. Observations Analysis and Implications,” Acta Metallurgica, Vol. 24, No. 10, PP. 939–956, 1976.
-
(1976)
Acta Metallurgica
, vol.24
, Issue.10
, pp. 939-956
-
-
Evans, A.G.1
Wilshaw, T.R.2
-
51
-
-
0019658428
-
Wear Mechanisms in Ceramics
-
Rigney D A, (ed)
-
Evans, A. G. and Marshall, D. B., “Wear Mechanisms in Ceramics,” in: Fundamentals of Friction and Wear of Meaterials, Rigney, D. A., (Ed.), American Society for Metals, 1981.
-
(1981)
Fundamentals of Friction and Wear of Meaterials
-
-
Evans, A.G.1
Marshall, D.B.2
-
53
-
-
0020832649
-
Review of Oxidational Wear: Part I: The Origins of Oxidational Wear
-
Quinn, T. F. J., “Review of Oxidational Wear: Part I: The Origins of Oxidational Wear,” Tribology International, Vol. 16, No. 5, pp. 257–271, 1983.
-
(1983)
Tribology International
, vol.16
, Issue.5
, pp. 257-271
-
-
Quinn, T.F.J.1
-
54
-
-
0020970970
-
Review of Oxidational Wear Part II: Recent Developments and Future Trends in Oxidational Wear Research
-
Quinn, T. F. J., “Review of Oxidational Wear Part II: Recent Developments and Future Trends in Oxidational Wear Research,” Tribology International, Vol. 16, No. 6, pp. 305–315, 1983.
-
(1983)
Tribology International
, vol.16
, Issue.6
, pp. 305-315
-
-
Quinn, T.F.J.1
-
55
-
-
0000549183
-
Elastic Deformation and the Laws of Friction
-
Archard, J. F., “Elastic Deformation and the Laws of Friction,” Proceedings of the Royal Society of London. Series A. Mathematical, Physical & Engineering Sciences, Vol. 243, No. 1233, pp. 190–205, 1957.
-
(1957)
Proceedings of the Royal Society of London. Series A. Mathematical, Physical & Engineering Sciences
, vol.243
, Issue.1233
, pp. 190-205
-
-
Archard, J.F.1
-
57
-
-
77949263581
-
Ultralow Nanoscale Wear through Atom-by-Atom Attrition in Silicon-Containing Diamond-Like Carbon
-
Bhaskaran, H., Gotsmann, B., Sebastian, A., Drechsler, U., Lantz, M. A., et al., “Ultralow Nanoscale Wear through Atom-by-Atom Attrition in Silicon-Containing Diamond-Like Carbon,” Nature Nanotechnology, Vol. 5, No. 3, pp. 181–185, 2010.
-
(2010)
Nature Nanotechnology
, vol.5
, Issue.3
, pp. 181-185
-
-
Bhaskaran, H.1
Gotsmann, B.2
Sebastian, A.3
Drechsler, U.4
Lantz, M.A.5
-
58
-
-
0034205713
-
AFM Studies on the Difference in Wear Behavior Between Si and SiO2 in KOH Solution
-
Katsuki, F., Kamei, K., Saguchi, A., Takahashi, W., and Watanabe, J., “AFM Studies on the Difference in Wear Behavior Between Si and SiO2 in KOH Solution,” Journal of the Electrochemical Society, Vol. 147, No. 6, pp. 2328–2331, 2000.
-
(2000)
Journal of the Electrochemical Society
, vol.147
, Issue.6
, pp. 2328-2331
-
-
Katsuki, F.1
Kamei, K.2
Saguchi, A.3
Takahashi, W.4
Watanabe, J.5
-
59
-
-
0043039452
-
Scratching the Surface: Fundamental Investigations of Tribology with Atomic Force Microscopy
-
Carpick, R. W. and Salmeron, M., “Scratching the Surface: Fundamental Investigations of Tribology with Atomic Force Microscopy,” Chemical Reviews, Vol. 97, No. 4, pp. 1163–1194, 1997.
-
(1997)
Chemical Reviews
, vol.97
, Issue.4
, pp. 1163-1194
-
-
Carpick, R.W.1
Salmeron, M.2
-
60
-
-
19644383574
-
Nano-Mechanical and Tribological Characteristics of Ultra-Thin Amorphous Carbon Film Investigated by AFM
-
Chung, K. H., Lee, J. W., and Kim, D. E., “Nano-Mechanical and Tribological Characteristics of Ultra-Thin Amorphous Carbon Film Investigated by AFM,” KSME International Journal, Vol. 18, No. 10, pp. 1772–1781, 2004.
-
(2004)
KSME International Journal
, vol.18
, Issue.10
, pp. 1772-1781
-
-
Chung, K.H.1
Lee, J.W.2
Kim, D.E.3
-
61
-
-
34249043693
-
Nano-Tribological Characteristics of PZT Thin Film Investigated by Atomic Force Microscopy
-
Chung, K. H., Lee, Y. H., Kim, Y. T., Kim, D. E., Yoo, J., and Hong, S., “Nano-Tribological Characteristics of PZT Thin Film Investigated by Atomic Force Microscopy,” Surface and Coatings Technology, Vol. 201, No. 18, pp. 7983–7991, 2007.
-
(2007)
Surface and Coatings Technology
, vol.201
, Issue.18
, pp. 7983-7991
-
-
Chung, K.H.1
Lee, Y.H.2
Kim, Y.T.3
Kim, D.E.4
Yoo, J.5
Hong, S.6
-
62
-
-
34249043693
-
Nano-Tribological Characteristics of PZT Thin Film Investigated by Atomic Force Microscopy
-
Chung, K. H., Lee, Y. H., Kim, Y. T., Kim, D. E., Yoo, J., and Hong, S., “Nano-Tribological Characteristics of PZT Thin Film Investigated by Atomic Force Microscopy,” Surface and Coatings Technology, Vol. 201, No. 18, pp. 7983–7991, 2007.
-
(2007)
Surface and Coatings Technology
, vol.201
, Issue.18
, pp. 7983-7991
-
-
Chung, K.H.1
Lee, Y.H.2
Kim, Y.T.3
Kim, D.E.4
Yoo, J.5
Hong, S.6
-
63
-
-
0029911943
-
Nanotubes as Nanoprobes in Scanning Probe Microscopy
-
Dai, H., Hafner, J. H., Rinzler, A. G., Colbert, D. T., and Smalley, R. E., “Nanotubes as Nanoprobes in Scanning Probe Microscopy,” Nature, Vol. 384, No. 6605, pp. 147–150, 1996.
-
(1996)
Nature
, vol.384
, Issue.6605
, pp. 147-150
-
-
Dai, H.1
Hafner, J.H.2
Rinzler, A.G.3
Colbert, D.T.4
Smalley, R.E.5
-
64
-
-
0034905469
-
Structural and Functional Imaging with Carbon Nanotube AFM Probes
-
Hafner, J. H., Cheung, C.-L., Woolley, A., and Lieber, C., “Structural and Functional Imaging with Carbon Nanotube AFM Probes,” Progress in Biophysics and Molecular Biology, Vol. 77, No. 1, pp. 73–110, 2001.
-
(2001)
Progress in Biophysics and Molecular Biology
, vol.77
, Issue.1
, pp. 73-110
-
-
Hafner, J.H.1
Cheung, C.-L.2
Woolley, A.3
Lieber, C.4
-
65
-
-
79957967645
-
Comparison of Wear Characteristics of Etched-Silicon and Carbon Nanotube Atomic-Force Microscopy Probes
-
Larsen, T., Moloni, K., Flack, F., Eriksson, M. A., Lagally, M. G., and Black, C. T., “Comparison of Wear Characteristics of Etched-Silicon and Carbon Nanotube Atomic-Force Microscopy Probes,” Applied Physics Letters, Vol. 80, No. 11, pp. 1996–1998, 2002.
-
(2002)
Applied Physics Letters
, vol.80
, Issue.11
, pp. 1996-1998
-
-
Larsen, T.1
Moloni, K.2
Flack, F.3
Eriksson, M.A.4
Lagally, M.G.5
Black, C.T.6
-
66
-
-
68949192795
-
Carbon Nanotube Tips for Atomic Force Microscopy
-
Wilson, N. R. and Macpherson, J. V., “Carbon Nanotube Tips for Atomic Force Microscopy,” Nature Nanotechnology, Vol. 4, No. 8, pp. 483–491, 2009.
-
(2009)
Nature Nanotechnology
, vol.4
, Issue.8
, pp. 483-491
-
-
Wilson, N.R.1
Macpherson, J.V.2
-
67
-
-
0033637522
-
Biomolecular Interactions Measured by Atomic Force Microscopy
-
Willemsen, O. H., Snel, M. M., Cambi, A., Greve, J., De Grooth, B. G., and Figdor, C. G., “Biomolecular Interactions Measured by Atomic Force Microscopy,” Biophysical Journal, Vol. 79, No. 6, pp. 3267–3281, 2000.
-
(2000)
Biophysical Journal
, vol.79
, Issue.6
, pp. 3267-3281
-
-
Willemsen, O.H.1
Snel, M.M.2
Cambi, A.3
Greve, J.4
De Grooth, B.G.5
Figdor, C.G.6
-
68
-
-
77749319323
-
Nanomechanical Properties of Thin Films of Type I Collagen Fibrils
-
Chung, K. H., Bhadriraju, K., Spurlin, T. A., Cook, R. F., and Plant, A. L., “Nanomechanical Properties of Thin Films of Type I Collagen Fibrils,” Langmuir, Vol. 26, No. 5, pp. 3629–3636, 2010.
-
(2010)
Langmuir
, vol.26
, Issue.5
, pp. 3629-3636
-
-
Chung, K.H.1
Bhadriraju, K.2
Spurlin, T.A.3
Cook, R.F.4
Plant, A.L.5
-
69
-
-
84885661754
-
-
Chung, K. H., Chen, A. K., Anderton, C. R., Bhadriraju, K., Plant, A. L., et al., “Frictional Properties of Native and Functionalized Type I Collagen Thin Films,” Applied Physics Letters, Vol. 103, No. 14, Paper No. 143703, 2013.
-
(2013)
Applied Physics Letters
, vol.103
, Issue.14
-
-
-
70
-
-
0000761953
-
Characterization of Tips for Conducting Atomic Force Microscopy
-
O’Shea, S., Atta, R., and Welland, M., “Characterization of Tips for Conducting Atomic Force Microscopy,” Review of Scientific Instruments, Vol. 66, No. 3, pp. 2508–2512, 1995.
-
(1995)
Review of Scientific Instruments
, vol.66
, Issue.3
, pp. 2508-2512
-
-
O’Shea, S.1
Atta, R.2
Welland, M.3
-
71
-
-
54749134556
-
-
Bhushan, B., Kwak, K. J., and Palacio, M., “Nanotribology and Nanomechanics of Afm Probe-based Data Recording Technology,” Journal of Physics: Condensed Matter, Vol. 20, No. 36, Paper No. 365207, 2008.
-
(2008)
Journal of Physics: Condensed Matter
, vol.20
, Issue.36
-
-
-
72
-
-
35549003606
-
-
Bhushan, B. and Kwak, K. J., “Velocity Dependence of Nanoscale Wear in Atomic Force Microscopy,” Applied Physics Letters, Vol. 91, No. 16, Paper No. 163113, 2007.
-
(2007)
Applied Physics Letters
, vol.91
, Issue.16
-
-
|