Fundamental investigation of the wear progression of silicon atomic force microscope probes

Tribology Letters

Volumn 52, Issue 2, 2013, Pages 315-325

  Chung, Koo Hyun ^a   Lee, Yong Ha ^b   Kim, Hae Jin ^c   Kim, Dae Eun ^c  

^a University of Ulsan   (South Korea)

^b Park Systems Corporation   (South Korea)

^c Yonsei University   (South Korea)

Author keywords

Atomic force microscope; Nanotribology; Probe radius; Wear coefficient

Indexed keywords

ADHESION FORCES; CONTACT PRESSURES; CONTACT STRESS; EXPONENTIAL DEPENDENCE; INITIAL WEARS; SLIDING DISTANCES; SLIDING SPEED; WEAR COEFFICIENT;

ATOMIC FORCE MICROSCOPY; NANOTRIBOLOGY; SILICON;

PROBES;

EID: 84890059511     PISSN: 10238883     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11249-013-0217-8     Document Type: Article

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