Nano-wear of the diamond AFM probing tip under scratching of silicon, studied by AFM

Tribology Letters

Volumn 2, Issue 4, 1996, Pages 345-354

  Khurshudov, Andrei G ^a   Kato, Koji ^b   Koide, Hiroyuki ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b TOHOKU UNIVERSITY   (Japan)

Author keywords

AFM; AFM tip wear; Diamond probing tip; Nano wear testing by AFM

Indexed keywords

EID: 0000668985     PISSN: 10238883     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF00156907     Document Type: Article

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