Nanolithography and manipulation of graphene using an atomic force microscope

Solid State Communications

Volumn 147, Issue 9-10, 2008, Pages 366-369

  Giesbers, A J M ^a   Zeitler, U ^a   Neubeck, S ^b   Freitag, F ^b   Novoselov, K S ^b   Maan, J C ^a  

^a RADBOUD UNIVERSITY NIJMEGEN   (Netherlands)

^b UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

A. Graphene; E. Atomic force microscopy; E. Nanolithography

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; ATOMS; CHEMICAL OXYGEN DEMAND; EXTREME ULTRAVIOLET LITHOGRAPHY; NANOLITHOGRAPHY; OPTICAL DESIGN; OXIDATION;

ATOMIC FORCE MICROSCOPE (AFM); DEVICE FABRICATIONS; DIFFERENT SUBSTRATES; ELSEVIER (CO); GRAPHENE; GRAPHENE FLAKES; GRAPHENE SHEETS; LENGTH SCALING; LOCAL ANODIC OXIDATION (LAO); MECHANICAL PEELING; SINGLE LAYERS;

ANODIC OXIDATION;

ANODIZATION; ASSEMBLY; ATOMS; LITHOGRAPHY; MICROSCOPY; OXIDATION; PEEL STRENGTH; PHYSICAL PROPERTIES; SHEET METAL; STRUCTURAL ANALYSIS; SUBSTRATES;

EID: 48049116880     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2008.06.027     Document Type: Article

References (34)

1. Wallace P.R. Phys. Rev. 71 (1947) 622
2. Kroto H.W., et al. Nature 318 (1985) 162
3. Iijima S. Nature 354 (1991) 56
4. Novoselov K.S., et al. Science 306 (2004) 666
5. Novoselov K.S., et al. Proc. Natl. Acad. Sci. USA 102 (2005) 10451
6. Geim A.K., and Novoselov K.S. Nature Mater. 6 (2006) 183
7. Morozov S.V., et al. Phys. Rev. Lett. 100 (2008) 016602
8. Bolotin K.I., et al. Solid State Commun. 146 (2008) 351
9. Williams J.R., DiCarlo L., and Marcus C.M. Science 317 (2007) 638
10. Huard B., et al. Phys. Rev. Lett. 98 (2007) 236803
11. Rycerz A., Tworzydlo J., and Beenakker C.W.J. Nature Phys. 3 (2007) 172
12. Katsnelson M.I., Novoselov K.S., and Geim A.K. Nature Phys. 2 (2006) 620
13. Han M.Y., Özyilmaz B., Zhang Y., and Kim P. Phys. Rev. Lett. 98 (2007) 206805
14. Trauzettel B., Bulgev D.V., Loss D., and Burkard G. Nature Phys. 3 (2007) 192
15. Stampfer C., et al. Appl. Phys. Lett. 92 (2008) 012102
16. Wendel M. Appl. Phys. Lett. 65 (1994) 1775
17. Schumacher H.W., et al. Appl. Phys. Lett. 75 (1999) 1107
18. Ishii M., and Matsumoto K. Japan J. Appl. Phys. Part 1 34 2B (1995) 1329
19. Held R., et al. Appl. Phys. Lett. 71 (1997) 2689
20. Lüscher S., et al. Appl. Phys. Lett. 75 (1999) 2452
21. Keyser U.F., et al. Appl. Phys. Lett. 76 (1999) 457
22. Fuhrer A., et al. Nature 413 (2001) 822
23. Roy H.-V., Kallinger C., Marsen B., and Sattler K. J. Appl. Phys. 83 (1998) 4695
24. Roy H.-V., Kallinger C., and Sattler K. Surf. Sci. 407 (1998) 1
25. Li L.X., et al. Carbon 44 (2006) 1544
26. Hiura H., Ebbesen T.W., Fujita J., Tanigaki K., and Takada T. Nature 367 (1994) 148
27. Lu X., et al. Nanotechnology 10 (1999) 269
28. Hiura H. Appl. Surf. Sci. 222 (2004) 374
29. Ebbesen T.W., and Hiura H. Adv. Mater. 7 6 (1995) 582
30. Regul J., et al. Appl. Phys. Lett. 81 (2002) 2023
31. P. Barthold, T. Lüdtke, R.J. Haug, arXiv:0803.2470(2007)
32. Molitor F., et al. Phys. Rev. B 76 (2007) 245426
33. Kobayashi Y., Fukui K., Enoki T., and Kusakabe K. Phys. Rev. B 73 (2006) 125415
34. Luna M., Colchero J., and Baro A.M. J. Phys. Chem. B 103 (1999) 9576