Method for characterizing nanoscale wear of atomic force microscope tips

ACS Nano

Volumn 4, Issue 7, 2010, Pages 3763-3772

  Liu, Jingjing ^a   Notbohm, Jacob K ^a   Carpick, Robert W ^b   Turner, Kevin T ^a  

^a University of Wisconsin Madison   (United States)

^b UNIVERSITY OF PENNSYLVANIA   (United States)

Author keywords

atomic force microscopy; nanotribology; probe; tip; wear

Indexed keywords

ADHESION FORCE MEASUREMENTS; AFM PROBE; ATOMIC FORCE MICROSCOPES; CONTACT-MODE AFM; DIRECT MEASUREMENT; MULTIPLE FAILURES; NANO SCALE; NANO-MANUFACTURING; NANOSCALE WEAR; PROBE TIPS; SYSTEMATIC PROCESS; TEM; TIP DEGRADATION; TIP WEAR; ULTRA-NANOCRYSTALLINE DIAMOND; VOLUME LOSS; WEAR TEST;

ADHESION; ATOMS; FORCE MEASUREMENT; FRACTURE; NANOSTRUCTURED MATERIALS; NANOTRIBOLOGY; PROBES; SCANNING ELECTRON MICROSCOPY; SILICON NITRIDE; TRANSMISSION ELECTRON MICROSCOPY;

ATOMIC FORCE MICROSCOPY;

EID: 77955536815     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn100246g     Document Type: Article

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38. Detection counts: A threshold parameter to eliminate the effect of high-frequency noise. The "acceptance level" establishes the tolerance of the levels of inconsistency between the image and the reconstructed tips
39. Tip height confidence graphs: Reconstructed tip heights as a function of detection counts.