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Ultramicroscopy

Volumn 108, Issue 1, 2007, Pages 1-10

Wear characteristics of diamond-coated atomic force microscope probe

(2) Chung, Koo Hyun a Kim, Dae Eun a

a Yonsei University (South Korea)

Author keywords

Atomic force microscope (AFM); Diamond coating; Fracture; Wear

Indexed keywords

DIAMONDS; PROBES; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

ARCHARD WEAR EQUATIONS; DIAMOND COATINGS; WEAR CHARACTERISTICS; WEAR COEFFICIENTS; WEAR RATES;

ATOMIC FORCE MICROSCOPY;

DIAMOND;

ARTICLE; ATOMIC FORCE MICROSCOPY; IMAGE ANALYSIS; IMAGE QUALITY; MECHANICAL PROBE; NANOANALYSIS; RAMAN SPECTROMETRY; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 35348992728 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/j.ultramic.2007.01.016 Document Type: Article

Times cited : (43)

References (35)

1
- 21544435813
- Marrian C.R.K., Perkins F.K., Brandow S.L., Koloski T.S., Dobisz E.A., and Calvert J.M. Appl. Phys. Lett. 64 (1994) 390
- (1994) Appl. Phys. Lett. , vol.64 , pp. 390
- Marrian, C.R.K.¹ Perkins, F.K.² Brandow, S.L.³ Koloski, T.S.⁴ Dobisz, E.A.⁵ Calvert, J.M.⁶

2
- 0342908968
- Dagata J.A., Schneir J., Harary H.H., Evans C.J., Postek M.T., and Bennett J. Appl. Phys. Lett. 56 (1990) 2001
- (1990) Appl. Phys. Lett. , vol.56 , pp. 2001
- Dagata, J.A.¹ Schneir, J.² Harary, H.H.³ Evans, C.J.⁴ Postek, M.T.⁵ Bennett, J.⁶

3
- 0000240088
- Schumacher H.W., Keyser U.F., Zeitler U., Haug R.J., and Eberl K. Appl. Phys. Lett. 75 (1999) 1107
- (1999) Appl. Phys. Lett. , vol.75 , pp. 1107
- Schumacher, H.W.¹ Keyser, U.F.² Zeitler, U.³ Haug, R.J.⁴ Eberl, K.⁵

4
- 0031557558
- Magno R., and Bennett B.R. Appl. Phys. Lett. 70 (1997) 1855
- (1997) Appl. Phys. Lett. , vol.70 , pp. 1855
- Magno, R.¹ Bennett, B.R.²

5
- 6144290977
- Mamin H.J., and Rugar D. Appl. Phys. Lett. 61 (1992) 1003
- (1992) Appl. Phys. Lett. , vol.61 , pp. 1003
- Mamin, H.J.¹ Rugar, D.²

6
- 0029256082
- Imura R., Koyanagi H., Miyamoto M., Kikukawa A., Shintani T., and Hosaka S. Microelectron. Eng. 27 (1995) 105
- (1995) Microelectron. Eng. , vol.27 , pp. 105
- Imura, R.¹ Koyanagi, H.² Miyamoto, M.³ Kikukawa, A.⁴ Shintani, T.⁵ Hosaka, S.⁶

7
- 14544289101
- Chung K.H., Lee Y.H., Kim D.E., Yoo J., and Hong S. IEEE Trans. Magn. 41 (2005) 849
- (2005) IEEE Trans. Magn. , vol.41 , pp. 849
- Chung, K.H.¹ Lee, Y.H.² Kim, D.E.³ Yoo, J.⁴ Hong, S.⁵

8
- 0742267879
- Chung K.H., and Kim D.E. Tribol. Lett. 15 (2003) 135
- (2003) Tribol. Lett. , vol.15 , pp. 135
- Chung, K.H.¹ Kim, D.E.²

9
- 34249030625
- Chung K.H., and Kim D.E. Int. J. Precis. Eng. Manuf. 5 (2004) 39
- (2004) Int. J. Precis. Eng. Manuf. , vol.5 , pp. 39
- Chung, K.H.¹ Kim, D.E.²

10
- 0034228369
- Bassani R., and D'Acunto M. Tribol. Int. 33 (2000) 443
- (2000) Tribol. Int. , vol.33 , pp. 443
- Bassani, R.¹ D'Acunto, M.²

11
- 10044257453
- Chung K.H., Lee Y.H., and Kim D.E. Ultramicroscopy 102 (2005) 161
- (2005) Ultramicroscopy , vol.102 , pp. 161
- Chung, K.H.¹ Lee, Y.H.² Kim, D.E.³

12
- 13344270633
- Archard J.F. J. Appl. Phys. 24 (1953) 981
- (1953) J. Appl. Phys. , vol.24 , pp. 981
- Archard, J.F.¹

13
- 0003946537
- Wiley, UK
- Rabinowicz E. Friction and Wear of Materials. second ed. (1995), Wiley, UK
- (1995) Friction and Wear of Materials. second ed.
- Rabinowicz, E.¹

14
- 79957967645
- Larsen T., Moloni K., Flack F., Eriksson M.A., Lagally M.G., and Black C.T. Appl. Phys. Lett. 80 (2002) 1996
- (2002) Appl. Phys. Lett. , vol.80 , pp. 1996
- Larsen, T.¹ Moloni, K.² Flack, F.³ Eriksson, M.A.⁴ Lagally, M.G.⁵ Black, C.T.⁶

15
- 0000494380
- Marti O., Drake B., and Hansma P.K. Appl. Phys. Lett. 51 (1987) 484
- (1987) Appl. Phys. Lett. , vol.51 , pp. 484
- Marti, O.¹ Drake, B.² Hansma, P.K.³

16
- 0000313118
- Niedermann P., Hänni W., Christoph R., and Burger J. J. Vac. Sci. Technol. A 14 (1996) 1233
- (1996) J. Vac. Sci. Technol. A , vol.14 , pp. 1233
- Niedermann, P.¹ Hänni, W.² Christoph, R.³ Burger, J.⁴

17
- 0029511006
- Cheng H.C., Ku T.K., Hsieh B.B., Chen S.H., Leu S.Y., Wang C.C., Chen C.F., Hsieh I.J., and Huang J.C.M. Jpn. J. Appl. Phys. 34 (1995) 6926
- (1995) Jpn. J. Appl. Phys. , vol.34 , pp. 6926
- Cheng, H.C.¹ Ku, T.K.² Hsieh, B.B.³ Chen, S.H.⁴ Leu, S.Y.⁵ Wang, C.C.⁶ Chen, C.F.⁷ Hsieh, I.J.⁸ Huang, J.C.M.⁹

18
- 0001824976
- Oesterschulze E., Scholz W., Mihalcea Ch., Albert D., Sobisch B., and Kulisch W. Appl. Phys. Lett. 70 (1997) 435
- (1997) Appl. Phys. Lett. , vol.70 , pp. 435
- Oesterschulze, E.¹ Scholz, W.² Mihalcea, Ch.³ Albert, D.⁴ Sobisch, B.⁵ Kulisch, W.⁶

19
- 0033892148
- Shibata T., Kitamoto Y., Unno K., and Makino E. J. Microelectromech. Syst. 9 (2001) 47
- (2001) J. Microelectromech. Syst. , vol.9 , pp. 47
- Shibata, T.¹ Kitamoto, Y.² Unno, K.³ Makino, E.⁴

20
- 36449000481
- Wendel M., Lorenz H., and Kotthaus J.P. Appl. Phys. Lett. 67 (1995) 3732
- (1995) Appl. Phys. Lett. , vol.67 , pp. 3732
- Wendel, M.¹ Lorenz, H.² Kotthaus, J.P.³

21
- 35348962519
- Nanotools GmbH, 〈http://www.nano-tools.com〉.

22
- 0037480757
- J.H. Bae, T. Ono, C. Konoma, M. Esashi, Scanning diamond probe and application to thermo-mechanical nanolithography, In: Proceedings of the 16th Annual International Conference, IEEE Microelectromech. Syst. (2003) 24.

23
- 0029307959
- Sumomogi T., Endo T., and Kuwahara K. J. Vac. Sci. Technol. B 13 (1995) 1257
- (1995) J. Vac. Sci. Technol. B , vol.13 , pp. 1257
- Sumomogi, T.¹ Endo, T.² Kuwahara, K.³

24
- 0036508322
- Oesterschulze E., Malavé A., Keyser U.F., Paesler M., and Haug R.J. Diam. Relat. Mater. 11 (2002) 667
- (2002) Diam. Relat. Mater. , vol.11 , pp. 667
- Oesterschulze, E.¹ Malavé, A.² Keyser, U.F.³ Paesler, M.⁴ Haug, R.J.⁵

25
- 19644383574
- Chung K.H., Lee J.W., and Kim D.E. KSME Int. J. 18 (2004) 1772
- (2004) KSME Int. J. , vol.18 , pp. 1772
- Chung, K.H.¹ Lee, J.W.² Kim, D.E.³

26
- 0037451322
- Álvarez D., Hartwich J., Fouchier M., Eyben P., and Vandervorst W. Appl. Phys. Lett. 82 (2003) 1724
- (2003) Appl. Phys. Lett. , vol.82 , pp. 1724
- Álvarez, D.¹ Hartwich, J.² Fouchier, M.³ Eyben, P.⁴ Vandervorst, W.⁵

27
- 0035998501
- Yabuhara H., Ciappa M., and Fichtner W. J. Vac. Sci. Technol. B 20 (2002) 783
- (2002) J. Vac. Sci. Technol. B , vol.20 , pp. 783
- Yabuhara, H.¹ Ciappa, M.² Fichtner, W.³

28
- 0031103317
- Khurshudov A., Kato K., and Koide H. Wear 203-204 (1997) 22
- (1997) Wear , vol.203-204 , pp. 22
- Khurshudov, A.¹ Kato, K.² Koide, H.³

29
- 4344590016
- Shibata T., Unno K., Makino E., and Shimada S. Sensors Actuators A-Phys. 114 (2004) 398
- (2004) Sensors Actuators A-Phys. , vol.114 , pp. 398
- Shibata, T.¹ Unno, K.² Makino, E.³ Shimada, S.⁴

30
- 2542461647
- Álvarez D., Fouchier M., Kretz J., Hartwich J., Schoemann S., and Vandervorst W. Microelectron. Eng. 73-74 (2004) 910
- (2004) Microelectron. Eng. , vol.73-74 , pp. 910
- Álvarez, D.¹ Fouchier, M.² Kretz, J.³ Hartwich, J.⁴ Schoemann, S.⁵ Vandervorst, W.⁶

31
- 0004097994
- MacGrow Hill
- Timoshenko S.P., and Goodier J.N. Theory of Elasticity (1987), MacGrow Hill
- (1987) Theory of Elasticity
- Timoshenko, S.P.¹ Goodier, J.N.²

32
- 0001519723
- Gogotsi Y.G., Kailer A., and Nickel K.G. J. Appl. Phys. 84 (1998) 1299
- (1998) J. Appl. Phys. , vol.84 , pp. 1299
- Gogotsi, Y.G.¹ Kailer, A.² Nickel, K.G.³

33
- 0030108018
- Gruen D.M., Krauss A.R., Zuiker C.D., Csencisits R., and Terminello L.J. Appl. Phys. Lett. 68 (1996) 1640
- (1996) Appl. Phys. Lett. , vol.68 , pp. 1640
- Gruen, D.M.¹ Krauss, A.R.² Zuiker, C.D.³ Csencisits, R.⁴ Terminello, L.J.⁵

34
- 4244187263
- Jiang N., Deguchi M., Wang C.L., Won J.H., Jeon H.M., Mori Y., Hatta A., Kitabatake M., Ito T., Hirao T., Sasaki T., and Hiraki A. Appl. Surf. Sci. 113-114 (1997) 254
- (1997) Appl. Surf. Sci. , vol.113-114 , pp. 254
- Jiang, N.¹ Deguchi, M.² Wang, C.L.³ Won, J.H.⁴ Jeon, H.M.⁵ Mori, Y.⁶ Hatta, A.⁷ Kitabatake, M.⁸ Ito, T.⁹ Hirao, T.¹⁰ Sasaki, T.¹¹ Hiraki, A.¹²

35
- 0033377792
- Bhushan B. Diam. Relat. Mater. 8 (1999) 1985
- (1999) Diam. Relat. Mater. , vol.8 , pp. 1985
- Bhushan, B.¹

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