An ultraclean tip-wear reduction scheme for ultrahigh density scanning probe-based data storage

ACS Nano

Volumn 4, Issue 10, 2010, Pages 5713-5720

  Tayebi, Noureddine ^a,b   Zhang, Yuegang ^a,c   Chen, Robert J ^a   Tran, Quan ^a   Chen, Rong ^a   Nishi, Yoshio ^b   Ma, Qing ^a   Rao, Valluri ^a  

^a INTEL CORPORATION   (United States)

^b Stanford University   (United States)

^c LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

ferroelectric media; nanotribology; probe based storage; wear

Indexed keywords

ATOMIC BONDS; CRYSTAL LAYER; DATA STORAGE; DEVICE LIFETIME; FERROELECTRIC MEDIA; HIGH SPEED SCANNING; LONG DISTANCES; MEDIA INTERFACE; MEMORY DEVICE; PLATINUM-IRIDIUM; PROBE TIPS; PROBE-BASED; PROBE-BASED STORAGE; READ SPEED; SLIDING DISTANCES; STORAGE DENSITIES; STRESS LEVELS; SURFACE CONTACT; THIN WATER LAYERS; ULTRAHIGH DENSITY; VISCO-ELASTIC MATERIAL; WEAR; WEAR ENDURANCE; WEAR PROCESS; WEAR REDUCTION;

FERROELECTRIC DEVICES; FERROELECTRICITY; IRIDIUM; LIQUID CRYSTALS; NANOTRIBOLOGY; PHASE INTERFACES; PLATINUM; PROBES;

FERROELECTRIC FILMS;

EID: 78049334941     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn1013512     Document Type: Article

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