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Volumn 106, Issue 2, 2011, Pages

Mechanism of wear and ripple formation induced by the mechanical action of an atomic force microscope tip

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPES; EXPERIMENTAL OBSERVATION; FRICTIONAL STRESS; MECHANICAL ACTION; NANO SCALE; NANO-SCALE PATTERNS; QUASI-PERIODIC; RIPPLE FORMATION; SIZE AND SHAPE; SURFACE CORRUGATIONS;

EID: 78651446207     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.106.025502     Document Type: Article
Times cited : (16)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.