Atomic forcemicroscope-based data storage: Track servo and wear study

Applied Physics A: Materials Science and Processing

Volumn 66, Issue SUPPL. 1, 1998, Pages

  Terris, B D ^a   Rishton, S A ^b   Mamin, H J ^a   Ried, R P ^a   Rugar, D ^a  

^a IBM ALMADEN RESEARCH CENTER   (United States)

^b IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPES; CONTROL METHODS; DATA STORAGE; DATA STORAGE TECHNOLOGY; DATA-TRACKING; HIGH DENSITY DATA STORAGE; HIGH FREQUENCY HF; HIGH SPATIAL RESOLUTION; PIEZO-RESISTIVE CANTILEVERS; SIGNAL AMPLITUDE; STANDARD DEVIATION; SYSTEM-BASED; TOPOGRAPHIC DATA; TRACK SERVO; TRACKING CONTROLS; TRAVEL DISTANCE;

ATOMIC FORCE MICROSCOPY; DISKS (STRUCTURAL COMPONENTS); ROTATING DISKS;

DATA STORAGE EQUIPMENT;

EID: 0012986514     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s003390051247     Document Type: Article

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