Insulated gate bipolar transistor reliability testing protocol for PV inverter applications

Progress in Photovoltaics: Research and Applications

Volumn 22, Issue 9, 2014, Pages 970-983

  Flicker, Jack ^a   Kaplar, Robert ^a   Yang, Benjamin ^a   Marinella, Matthew ^a   Granata, Jennifer ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

BOS; IGBT; photovoltaic; power electronics; reliability; transistors

Indexed keywords

EXPERIMENTS; PHOTOVOLTAIC CELLS; POWER ELECTRONICS; RELIABILITY; TRANSISTORS;

BOS; COST OF OWNERSHIP; INSULATED GATE; PHOTOVOLTAIC; PHOTOVOLTAIC INVERTERS; PHOTOVOLTAIC SYSTEMS; PUBLIC DOMAINS; TRANSISTOR RELIABILITY;

INSULATED GATE BIPOLAR TRANSISTORS (IGBT);

EID: 84906251094     PISSN: 10627995     EISSN: 1099159X     Source Type: Journal    
DOI: 10.1002/pip.2351     Document Type: Article

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