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Volumn 2, Issue , 2005, Pages 799-805

Analysis of insulation failure modes in high power IGBT modules

Author keywords

Electroluminescence; Insulation failures; Partial discharge; Power module

Indexed keywords

CERAMIC MATERIALS; ELECTRIC DISCHARGES; ELECTRIC INSULATION; ELECTRIC RESISTANCE; ELECTROLUMINESCENCE; FAILURE ANALYSIS;

EID: 33745922124     PISSN: 01972618     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IAS.2005.1518425     Document Type: Conference Paper
Times cited : (98)

References (13)
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    • Mitic, G.1    Lefranc, G.2
  • 5
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    • Electrical field investigation in high voltage power modules using finite element simulations and partial discharge measurements
    • 38th IAS Annual Meeting. 12-16 Oct.
    • D. Frey, J.L. Schanen, J.L. Auge, O. Lesaint, "Electrical field investigation in high voltage power modules using Finite Element simulations and Partial Discharge measurements", Industry Applications Conference, 2003. 38th IAS Annual Meeting. 12-16 Oct. 2003, Vol. 2, pp. 1000-1005.
    • (2003) Industry Applications Conference, 2003 , vol.2 , pp. 1000-1005
    • Frey, D.1    Schanen, J.L.2    Auge, J.L.3    Lesaint, O.4
  • 6
    • 51049083117 scopus 로고    scopus 로고
    • Reduction of degrading effects in insulating materials in power semiconductor devices by optimising the internal structure
    • Th. Ebke, B. Bakija, D. Peier, "Reduction of degrading effects in insulating materials in power semiconductor devices by optimising the internal structure," Journal of Electrical Engineering, vol. 2, pp 145-150, 2002.
    • (2002) Journal of Electrical Engineering , vol.2 , pp. 145-150
    • Ebke, T.1    Bakija, B.2    Peier, D.3
  • 9
    • 0344834895 scopus 로고    scopus 로고
    • Asea Brown Boveri Corporate Research, Heidelberg
    • Z. Andjelic, "POLOPT 4.5 User s Guide", Asea Brown Boveri Corporate Research, Heidelberg, 1996
    • (1996) POLOPT 4.5 User S Guide
    • Andjelic, Z.1
  • 13
    • 4544307772 scopus 로고    scopus 로고
    • Partial discharge failure analysis of AlN substates for IGBT modules
    • J.H. Fabian, S. Hartmann, A. Hamidi, "Partial Discharge failure analysis of AlN substates for IGBT modules", Microelectronics Reliability, vol. 44, pp. 1425-1439, 2004.
    • (2004) Microelectronics Reliability , vol.44 , pp. 1425-1439
    • Fabian, J.H.1    Hartmann, S.2    Hamidi, A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.