Investigation of the short-circuit performance of an IGBT

IEEE Transactions on Electron Devices

Volumn 45, Issue 1, 1998, Pages 313-320

  Trivedi, Malay ^a   Shenai, Krishna ^a  

^a 1120 Science and Engineering Offices   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC BREAKDOWN OF SOLIDS; SHORT CIRCUIT CURRENTS; STRESS ANALYSIS;

INSULATED GATE BIPOLAR TRANSISTORS (IGBT);

BIPOLAR TRANSISTORS;

EID: 0031673050     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.658847     Document Type: Article

References (8)

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