Behaviour of IGBT modules under short circuit conditions

Conference Record - IAS Annual Meeting (IEEE Industry Applications Society)

Volumn 5, Issue , 2000, Pages 3010-3015

  Palmer, P R ^a   Rajamani, H S ^a   Joyce, J C ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; COMPUTER SIMULATION; ELECTRIC IMPEDANCE; ELECTRIC POTENTIAL; ELECTRIC VARIABLES MEASUREMENT; INTEGRATED CIRCUIT TESTING; MICROPROCESSOR CHIPS; SHORT CIRCUIT CURRENTS;

CURRENT SHARING; SHORT CIRCUIT CHIP CURRENTS;

INSULATED GATE BIPOLAR TRANSISTORS;

EID: 0034515555     PISSN: 01972618     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)