Towards prognostics for electronics components

IEEE Aerospace Conference Proceedings

Volumn , Issue , 2009, Pages

  Saha, Bhaskar ^a   Celaya, Jose R ^a   Wysocki, Philip F ^a   Goebel, Kai F ^a  

^a NASA AMES RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACCELERATED AGING TEST; AIRCRAFT SYSTEMS; AVIONICS SYSTEMS; ELECTRICAL TRANSIENTS; ELECTRONICS COMPONENTS; HEALTH MANAGEMENT; IGBT DEVICES; IN-SITU; OVERSTRESSES; PARTICLE FILTER; REMAINING USEFUL LIFE PREDICTIONS; RESEARCH FIELDS; STATE MONITORING; STEADY STATE VOLTAGE; SYSTEM LEVELS; THERMAL TRANSIENTS;

ACTIVE FILTERS; AIRCRAFT; BIPOLAR TRANSISTORS; INSULATED GATE BIPOLAR TRANSISTORS (IGBT); TESTING; TRANSIENTS;

AVIONICS;

EID: 70349154678     PISSN: 1095323X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/AERO.2009.4839676     Document Type: Conference Paper

References (17)

1. N. Patil, D. Das, K. Goebel, and M. Pecht, "Failure Precursors for Insulated Gate Bipolar Transistors (IGBTs)," in International Conference on Prognostics and Health Management, 2008.
2. G. Sonnenfeld, K. Goebel, and J. Celaya, "An Agile Accelerated Aging, Characterization and Scenario Simulation System for Gate Controlled Power Transistors," in IEEE AUTOTESTCON, 2008.
3. A. Ginart, M. Roemer, P. Kalgren, and K. Goebel, "Modeling Aging Effects of IGBTs in Power Drives by Ringing Characterization," in International Conference on Prognostics and Health Management, 2008.
4. E. Ameraseka and F. Najm, Failure Mechanisms in Semiconductor Devices, 2nd ed.: John Wiley & Sons Ltd, 1998.
5. D. L. Goodman, "Prognostic methodology for deep submicron semiconductor failure modes," IEEE Trans. on Components and Packaging Technologies, vol. 24, March 2001.
6. W. Wu, M. Held, P. Jacob, P. Scacco, and A. Birolini, "Thermal Stress Related Packaging Failure in Power IGBT Modules," in International Symposium on Power Semiconductor Devices & ICs, Yokohama, 1995, pp. 330-334.
7. R. Orsagh, D. Brown, M. Roemer, T. Dabney, and T. Hess, "Prognostic Health Management for Avionics System Power Supplies," in IEEE Aerospace Conference, 2005.
8. A. Morozumi, K. Yamada, T. Miyasaka, S.Sumi, and Y. Seki, "Reliability of Power Cycling for IGBT Power Semiconductor Modules," IEEE Transactions on Industry Applications, vol. 39, pp. 665-671, 2003.
9. J. H. Stathis, B. P. Linder, K. L. Pey, F. Palumbo, and C. H. Tung, "Dielectric Breakdown Mechanisms in Gate Oxides," Journal of Applied Physics, vol. 98, 2005.
10. F. Reynolds, "Thermally Accelerated Aging Of Semiconductor Components," Proceeding of the IEEE, vol. 62, 1974.
11. C. Diaz, "Automation of Electrical Overstress Characterization for Semiconductor Devices," Hewlett-Packard Journal, pp. 106-111, October 1994.
12. M. Trivedi and K. Shenai, "Failure Mechanisms of IGBT's Under Short-Circuit and Clamped Inductive Switching Stress," IEEE Transactions on Power Electronics, vol. 14, 1999.
13. G. Buh, H. Chung, and Y. Kuk, "Real-Time evolution of trapped charge in a SiO2 layer: An electrostatic force," Applied Physics Letters, vol. 79, pp. 2010-2012, 2001.
14. N. Lifshitz and G. Smolinsky, "Hot-Carrier Aging of the MOS Transistor in the Presence of Spin-on Glass as the Inter level Dielectric," IEEE Electron Device Letters, vol. 12, pp. 140-142, March 1991.
15. A. A. Kuntman, A. Ardali, H. Kuntman, and F. Kacar, "A Weibull Distribution-Based New Approach To Represent Hot Carrier Degradation in Threshold Voltage of MOS Transistors," Solid-State Electronics, vol. 48, pp. 217-223, 2004.
16. S. Arulampalam, S. Maskell, N. J. Gordon, and T. Clapp, "A Tutorial on Particle Filters for On-line Non-linear/Non-Gaussian Bayesian Tracking," IEEE Transactions on Signal Processing, vol. 50, pp. 174-188, 2002.
17. B. Saha and K. Goebel, "Uncertainty Management for Diagnostics and Prognostics of Batteries using Bayesian Techniques," in IEEE Aerospace Conference, 2008.