Online ringing characterization as a diagnostic technique for IGBTs in power drives

IEEE Transactions on Instrumentation and Measurement

Volumn 58, Issue 7, 2009, Pages 2290-2299

  Ginart, Antonio E ^a   Brown, Douglas W ^b   Kalgren, Patrick W ^a   Roemer, Michael J ^a  

^a IMPACT TECHNOLOGIES LLC   (United States)

^b GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

AC machines; Aging; Diagnostic; Insulated gate bipolar transistors (IGBTs); Inverters; Power devices

Indexed keywords

AC MACHINES; AGING; DIAGNOSTIC; INVERTERS; POWER DEVICES;

ACTIVE FILTERS; BIPOLAR TRANSISTORS; DRIVES; ELECTRIC FILTERS; ELECTRIC MACHINERY; ELECTRON TUBES; FREQUENCY RESPONSE; PARAMETRIC DEVICES; PULSE WIDTH MODULATION;

INSULATED GATE BIPOLAR TRANSISTORS (IGBT);

EID: 67649595438     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2009.2013920     Document Type: Conference Paper

References (20)

1. AN908 Using the dsPIC30F for Vector Control of an ACIM, Microchip Technol. Inc., Chandler, AZ, 2004.
2. M. A. Rodríguez, A. Claudio, D. Theilliol, and L. G. Vela, "A new fault detection technique for IGBT based on gate voltage monitoring," in Proc. PESC, 2007, pp. 1000-1005.
3. P. Srinivasan, "Reliability of solder die attaches for high power application," M.S. thesis, Dept. Mech. Eng., Univ. Maryland, College Park, MD, 2000.
4. D. C. Katsis, "Thermal characterization of die-attach degradation in the power MOSFET," Ph.D. dissertation, Virginia Polytechnic Inst., Blacksburg, VA, 2003.
5. W. Wu, G. Gao, L. Dong, Z. Wang, M. Held, P. Jacob, and P. Scacco, "Thermal reliability of power insulated gate bipolar transistor (IGBT) modules," in Proc. 12th Annu. IEEE Semicond. Thermal Meas. Manag. Symp., 1996, pp. 136-141.
6. D. C. Katsis and J. D. van Wyk, "Void-induced thermal impedance in power semiconductor modules: Some transient temperature effects," IEEE Trans. Ind. Appl., vol. 39, no. 5, pp. 1239-1246, Sep./Oct. 2003.
7. S. B. Lee, K. Younsi, and G. B. Kliman, "An on-line technique for monitoring the insulation condition of AC machine stator windings," IEEE Trans. Energy Convers., vol. 20, no. 4, pp. 737-745, Dec. 2005.
8. S. B. Lee, R. M. Tallam, and T. G. Habetler, "A robust, on-line turn-fault detection technique for induction machines based on monitoring the sequence component impedance matrix," IEEE Trans. Power Electron., vol. 18, no. 3, pp. 865-872, May 2003.
9. D. K. Scroder, Semiconductor Material and Device Characterization. New York: Wiley, 1990.
10. S. Clemente, B. R. Pelly, and A. Isidori, "Understanding HEXFET switching performance," in HEXFET Power MOSFETs Designer Manual, vol. I. El Segundo, CA: Int. Rectifier, 1993. Application Note 947, Application Notes and Reliability Data.
11. R. Pearce, S. Brown, and D. Grant, "Measuring HEXFET characteristics," in HEXFET Power MOSFETs Designer Manual, vol. I. El Segundo, CA: Int. Rectifier, 1993. Application Note 957B, Application Notes and Reliability Data.
12. G. Stone, E. A. Boulter, I. Culbert, and H. Dhirani, Electrical Insulation for Rotating Machines. Piscataway, NJ: IEEE, 2004.
13. Guide for Testing Turn-to-Turn Insulation on Form Wound Stator Coils for Alternating Current Rotating Electrical Machines, IEEE 522-1992, 1992.
14. W. W. Sheng and R. P. Colino, Power Electronic Module: Design and Manufacture. Boca Raton, FL: CRC, 2004.
15. 2 layers in MOS devices," Microelectron. Reliab., vol. 44, no. 1, pp. 1-23, Jan. 2004.
16. A. A. Feinberg, P. Ersland, V. Kaper, and A. Widom, "On aging of key transistor device parameters," in Proc. Inst. Environ. Sci. Technol. 2000, pp. 231-236.
17. A. A. Feinberg and A. Widom, "On thermodynamic reliability engineering," IEEE Trans. Rel., vol. 49, no. 2, pp. 136-146, Jun. 2000.
18. D. Kastha and B. K. Bose, "Investigation of fault modes of voltage-fed inverter system for induction motor drive," IEEE Trans. Ind. Appl. vol. 30, no. 4, pp. 1028-1038, Jul./Aug. 1994.
19. R. L. de Araujo Ribeiro, C. B. Jacobina, E. R. Da Silva, and A. M. N. Lima, "Fault detection of open-switch damage in voltage-fed PWM motor drive systems," IEEE Trans. Power Electron., vol. 18, no. 2, pp. 587-593, Mar. 2003.
20. K. Kundert, Modeling Dielectric Absorption in Capacitors, Designer's Guide Consulting, Inc. [Online]. Available: www.designers-guide.org