Modeling aging effects of IGBTs in power drives by ringing characterization

2008 International Conference on Prognostics and Health Management, PHM 2008

Volumn , Issue , 2008, Pages

  Ginart, Antonio ^a   Roemer, Michael J ^a   Kalgren, Patrick W ^a   Goebel, Kai ^b  

^a IMPACT TECHNOLOGIES LLC   (United States)

^b NASA AMES RESEARCH CENTER   (United States)

Author keywords

Electronics aging; Functional; IGBT aging; Model; Physics of failure model; Prognostics for electronics

Indexed keywords

ACTIVE FILTERS; DRIVES; HEALTH; INSULATED GATE BIPOLAR TRANSISTORS (IGBT);

ELECTRONICS AGING; FUNCTIONAL; IGBT AGING; MODEL; PHYSICS-OF-FAILURE MODEL; PROGNOSTICS FOR ELECTRONICS;

MODELS;

EID: 58449088802     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PHM.2008.4711463     Document Type: Conference Paper

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