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Microelectronics Reliability

Volumn 42, Issue 4-5, 2002, Pages 653-667

Selected failure mechanisms of modern power modules

(1) Ciappa, Mauro a

a ETH ZURICH (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

COOLING; COSMIC RAYS; ELECTRIC TRACTION; ENERGY DISSIPATION; FAILURE ANALYSIS; ISOTOPES; RELIABILITY; THYRISTORS;

POWER MODULES;

INSULATED GATE BIPOLAR TRANSISTORS;

EID: 0036540853 PISSN: 00262714 EISSN: None Source Type: Journal
DOI: 10.1016/S0026-2714(02)00042-2 Document Type: Article

Times cited : (908)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.