Advanced computing in electron microscopy: Second edition

Advanced Computing in Electron Microscopy: Second Edition

Volumn , Issue , 2010, Pages 1-289

  Kirkland, Earl J ^a  

^a Cornell University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84885825158     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1007/978-1-4419-6533-2     Document Type: Book

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