Some effects of electron channeling on electron energy loss spectroscopy

Ultramicroscopy

Volumn 102, Issue 3, 2005, Pages 199-207

  Kirkland, Earl J ^a  

^a School of Chemical and Molecular Engineering   (United States)

Author keywords

Channeling; EELS; ELNES; Silicon L23 edge

Indexed keywords

ATOMIC ORBITALS; CRYSTALLINE SOLID; DENSITY OF STATES; ELECTRON CHANNELING;

CRYSTALLINE MATERIALS; ELECTRON BEAMS; ELECTRON SCATTERING; ELECTRONS; SILICON;

ELECTRON ENERGY LOSS SPECTROSCOPY;

ARTICLE; CALCULATION; DENSITY; ELECTRON; ELECTRON BEAM; ELECTRON ENERGY LOSS SPECTROSCOPY; SOLID; STATISTICAL SIGNIFICANCE; THEORETICAL STUDY;

ALGORITHMS; ELECTRONS; MICROSCOPY, ELECTRON; MODELS, THEORETICAL; SILICON; SPECTROSCOPY, ELECTRON ENERGY-LOSS;

ANGUILLIFORMES;

EID: 11444251685     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2004.09.010     Document Type: Article

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