Effects of amorphous layers on ADF-STEM imaging

Ultramicroscopy

Volumn 108, Issue 8, 2008, Pages 791-803

  Mkhoyan, K A ^a   Maccagnano Zacher, S E ^a   Kirkland, E J ^a   Silcox, J ^a  

^a School of Chemical and Molecular Engineering   (United States)

Author keywords

Aberration correction; ADF imaging; Multislice simulation; Si; STEM

Indexed keywords

ABERRATIONS; ATOMIC PHYSICS; ATOMS; COLUMNS (STRUCTURAL); CRYSTAL ORIENTATION; CRYSTAL STRUCTURE; CRYSTALLINE MATERIALS; ELECTROMAGNETIC FIELD THEORY; ELECTROMAGNETIC FIELDS; ELECTROMAGNETISM; GAUSSIAN BEAMS; MAGNETISM; MICROFLUIDICS; OPTICAL PROPERTIES; OPTICS; POWDERS; SURFACE PROPERTIES; SURFACES; VISIBILITY;

(1 1 0) SURFACE; (1 1 1) ORIENTATION; AMORPHOUS LAYERS; ATOMIC COLUMNS; DEFOCUS; ELSEVIER (CO); ENTRY SURFACE; GAUSSIAN BACKGROUND; HIGH RESOLUTIONS; IMAGE CONTRASTS; LINEAR REDUCTION; SCATTERED ELECTRONS;

CRYSTAL ATOMIC STRUCTURE;

ARTICLE; CONTRAST ENHANCEMENT; CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; IMAGE ANALYSIS; IMAGING SYSTEM; MICROANALYSIS; NORMAL DISTRIBUTION; SCANNING ELECTRON MICROSCOPY; SMALL ANGLE SCATTERING; TRANSMISSION ELECTRON MICROSCOPY;

EID: 45449101660     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2008.01.007     Document Type: Article

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