New scheme for calculation of annular dark-field STEM image including both elastically diffracted and TDS waves

Journal of Electron Microscopy

Volumn 50, Issue 3, 2001, Pages 157-162

  Mitsuishi, K ^a   Takeguchi, M ^a   Yasuda, H ^a   Furuya, K ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

Bethe method; Multislice method; Scanning transmission electron microscope

Indexed keywords

ARTICLE;

BETHE METHOD; DARK-FIELD; DIFFUSE SCATTERING; HIGH-ANGLE ANNULAR DARK FIELDS; MULTISLICE METHODS; NAKAMURA METHOD; SCANNING TRANSMISSION ELECTRON MICROSCOPES; SCATTERING WAVES; STEM IMAGES; THERMAL;

TRANSMISSION ELECTRON MICROSCOPY;

EID: 0034935387     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/jmicro/50.3.157     Document Type: Article

References (21)

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